Determination of the Optical Constants of Gallium Oxide Films

Transmission spectrum and reflectance spectrum have long been used to characterize gap semiconductor. Transmission spectrum can be measured very directly, but the influence of substrate absorption is often unavoidable. However, when using the reflectance spectrum measurement, the absorption of thin film, substrate absorption, and coherent interference will make the reflectance spectrum much more complicated. In this paper, Considering the absorption of thin film, substrate absorption, and coherent interference, we use the envelope curves algorithm to achieve the calculation formula of refractive index deduced from the reflectance spectrum. Through the analysis of the reflectance spectrum of Ga2O3film, we achieved thickness of the film, refractive index, extinction and absorption coefficient and dispersion constant.

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Determination of nonlinear optical constants in amorphous As/sub 2/S/sub 3/ thin film by transmission spectrum

CLEO/Pacific Rim 2003. The 5th Pacific Rim Conference on Lasers and Electro-Optics (IEEE Cat. No.03TH8671) ◽

10.1109/cleopr.2003.1277083 ◽

2004 ◽

Author(s):

S.Y. Woo ◽

S.J. Lee ◽

E.J. Kim ◽

H.R. Yang ◽

G.Y. Kim ◽

...

Keyword(s):

Thin Film ◽

Transmission Spectrum ◽

Nonlinear Optical ◽

Optical Constants

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Multiple determination of the optical constants of thin-film coating materials: a Rh sequel

Applied Optics ◽

10.1364/ao.25.001299 ◽

1986 ◽

Vol 25 (8) ◽

pp. 1299 ◽

Cited By ~ 15

Author(s):

D. E. Aspnes ◽

H. G. Craighead

Keyword(s):

Thin Film ◽

Optical Constants ◽

Film Coating ◽

Thin Film Coating ◽

Coating Materials ◽

Multiple Determination

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Determination of thermo-optic coefficient, refractive index, optical dispersion and group velocity parameters of an organic thin film

Physica B Condensed Matter ◽

10.1016/j.physb.2007.01.017 ◽

2007 ◽

Vol 393 (1-2) ◽

pp. 304-309 ◽

Cited By ~ 23

Author(s):

F. Yakuphanoglu ◽

M. Arslan

Keyword(s):

Thin Film ◽

Refractive Index ◽

Group Velocity ◽

Organic Thin Film ◽

Optical Dispersion

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Tables for the Determination of the Refractive Index and of the Thickness of the Thin Film by the Polarimetric Method

Journal of the Optical Society of America ◽

10.1364/josa.37.000979 ◽

1947 ◽

Vol 37 (12) ◽

pp. 979 ◽

Cited By ~ 8

Author(s):

Antonin Vašiček

Keyword(s):

Thin Film ◽

Refractive Index

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Determination of the optical constants of a vacuum evaporated polythiophene thin film

Physica Scripta ◽

10.1088/0031-8949/84/04/045801 ◽

2011 ◽

Vol 84 (4) ◽

pp. 045801 ◽

Cited By ~ 4

Author(s):

Sandip V Kamat ◽

Vijaya Puri ◽

R K Puri

Keyword(s):

Thin Film ◽

Optical Constants

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Determination of thin‐film optical constants with an automatic reflectance and transmittance goniometer

Review of Scientific Instruments ◽

10.1063/1.1142254 ◽

1991 ◽

Vol 62 (10) ◽

pp. 2398-2404 ◽

Cited By ~ 3

Author(s):

G. Bader ◽

P. V. Ashrit ◽

S. Elouatik ◽

F. E. Girouard ◽

Vo‐Van Truong

Keyword(s):

Thin Film ◽

Optical Constants

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Influence of substrate absorption on accuracy of determination of refractive index and thickness of uniform thin chalcogenide Cu1[As2(S0.5Se0.5)3]99 film

Thin Solid Films ◽

10.1016/j.tsf.2009.10.025 ◽

2010 ◽

Vol 518 (20) ◽

pp. 5679-5682 ◽

Cited By ~ 1

Author(s):

D.D. Štrbac ◽

S.R. Lukić ◽

D.M. Petrović ◽

J.M. Gonzalez-Leal ◽

A. Srinivasan ◽

...

Keyword(s):

Refractive Index ◽

Influence Of Substrate

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Determination of thin film refractive index and thickness by means of film phase thickness

Open Physics ◽

10.2478/s11534-008-0035-z ◽

2008 ◽

Vol 6 (2) ◽

Cited By ~ 3

Author(s):

Milen Nenkov ◽

Tamara Pencheva

Keyword(s):

Thin Film ◽

Thin Films ◽

Refractive Index ◽

Barium Titanate ◽

Spectral Region ◽

Complex Refractive Index ◽

Refractive Index Dispersion ◽

New Approach ◽

Phase Thickness

AbstractA new approach for determination of refractive index dispersion n(λ) (the real part of the complex refractive index) and thickness d of thin films of negligible absorption and weak dispersion is proposed. The calculation procedure is based on determination of the phase thickness of the film in the spectral region of measured transmittance data. All points of measured spectra are included in the calculations. Barium titanate thin films are investigated in the spectral region 0.38–0.78 μm and their n(λ) and d are calculated. The approach is validated using Swanepoel’s method and it is found to be applicable for relatively thin films when measured transmittance spectra have one minimum and one maximum only.

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