Metastable Phase Formation in Fe-Al Thin Films Cocondensed by Cross-Beam Pulsed Laser Deposition

2000 ◽  
Vol 343-346 ◽  
pp. 249-254 ◽  
Author(s):  
H. Geisler ◽  
A. Mensch ◽  
A. Tselev ◽  
A.I. Gorbunov ◽  
H. Worch
2014 ◽  
Vol 288 ◽  
pp. 381-391 ◽  
Author(s):  
Ying Wang ◽  
Rohit Medwal ◽  
Neeru Sehdev ◽  
Boluo Yadian ◽  
T.L. Tan ◽  
...  

2018 ◽  
Vol 59 (1) ◽  
pp. 33-38 ◽  
Author(s):  
Akihiro Ishii ◽  
Itaru Oikawa ◽  
Masaaki Imura ◽  
Toshimasa Kanai ◽  
Hitoshi Takamura

2021 ◽  
Author(s):  
Lauren M. Garten ◽  
Praneetha Selvarasu ◽  
John Perkins ◽  
David Ginley ◽  
Andriy Zakutayev

The manganese oxide thin films deposited by PLD in this work vary significantly from the expected equilibrium phases of the bulk materials or nanoparticles.


2001 ◽  
Vol 11 (PR11) ◽  
pp. Pr11-65-Pr11-69
Author(s):  
N. Lemée ◽  
H. Bouyanfif ◽  
J. L. Dellis ◽  
M. El Marssi ◽  
M. G. Karkut ◽  
...  

2001 ◽  
Vol 11 (PR11) ◽  
pp. Pr11-133-Pr11-137
Author(s):  
J. R. Duclère ◽  
M. Guilloux-Viry ◽  
A. Perrin ◽  
A. Dauscher ◽  
S. Weber ◽  
...  

2002 ◽  
Vol 720 ◽  
Author(s):  
Costas G. Fountzoulas ◽  
Daniel M. Potrepka ◽  
Steven C. Tidrow

AbstractFerroelectrics are multicomponent materials with a wealth of interesting and useful properties, such as piezoelectricity. The dielectric constant of the BSTO ferroelectrics can be changed by applying an electric field. Variable dielectric constant results in a change in phase velocity in the device allowing it to be tuned in real time for a particular application. The microstructure of the film influences the electronic properties which in turn influences the performance of the film. Ba0.6Sr0.4Ti1-y(A 3+, B5+)yO3 thin films, of nominal thickness of 0.65 μm, were synthesized initially at substrate temperatures of 400°C, and subsequently annealed to 750°C, on LaAlO3 (100) substrates, previously coated with LaSrCoO conductive buffer layer, using the pulsed laser deposition technique. The microstructural and physical characteristics of the postannealed thin films have been studied using x-ray diffraction, scanning electron microscopy, and nano indentation and are reported. Results of capacitance measurements are used to obtain dielectric constant and tunability in the paraelectric (T>Tc) regime.


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