scholarly journals Leakage Currents of Zinc Oxide Surge Arresters in 22 kV Distribution System Using Thermal Image Camera

2014 ◽  
Vol 02 (04) ◽  
pp. 712-717 ◽  
Author(s):  
Wichet Thipprasert ◽  
Prakasit Sritakaew
Keyword(s):  
Zinc Oxide ◽  
Distribution System ◽  
Thermal Image ◽  
Leakage Currents ◽  
Surge Arresters ◽  
Thermal Image Camera ◽  
Image Camera

Electrical Performance of Zinc Oxide Surge Arresters in 22 kV Distribution System Using Thermal Image Camera

2014 ◽  
Vol 931-932 ◽  
pp. 857-861
Author(s):  
Wichet Thipprasert
Keyword(s):  
Zinc Oxide ◽  
Leakage Current ◽  
Distribution System ◽  
Reducing Power ◽  
Thermal Image ◽  
Electrical Performance ◽  
Surge Arresters ◽  
Thermal Image Camera ◽  
Long Time ◽  
Image Camera

Zinc Oxide (ZnO) surge arresters (SAs) experience thermal runaway when the temperature exceeds the acceptable limit. This phenomenon is associated with the increase in resistive leakage current due to degradation. This paper presents the electrical performance of ZnO SAs in 22 kV distribution system using thermal image camera under the power frequency AC operating voltages. When ZnO surge arresters are installation takes a long time in distribution system over than 5 years. For the experimental study, as ZnO installation takes a long time over than 6 years the leakage current is 63.9 mA, temperature difference were measured over a period of time over than 14 degree Celsius. This data will be useful as a guideline for solving problems and reducing power loss from leakage current. Moreover, it will be useful in predicting lifetime of ZnO SAs.

Development of advanced built-in surge arresters for distribution system with new zinc-oxide elements

2001 ◽  
Vol 16 (4) ◽  
pp. 576-581 ◽  
Author(s):  
M. Hama ◽  
H. Ishizaka ◽  
J. Shimizu ◽  
S. Nishiki ◽  
I. Kaku
Keyword(s):  
Zinc Oxide ◽  
Distribution System ◽  
Surge Arresters

Analytical and Experimental Approach to the Voltage Distribution on Gapless Zinc-Oxide Surge Arresters

1981 ◽  
Vol PER-1 (11) ◽  
pp. 41-42 ◽  
Author(s):  
M. Oyama ◽  
I. Ohshima ◽  
M. Honda ◽  
M. Yamashita ◽  
S. Kojima
Keyword(s):  
Zinc Oxide ◽  
Experimental Approach ◽  
Voltage Distribution ◽  
Surge Arresters

scholarly journals Studi Pola Arus Bocor Isolator Keramik Selama Waktu Pemakaian 24 Jam

2020 ◽  
Vol 3 (3) ◽  
Author(s):  
Dini Fauziah ◽  
Waluyo Waluyo ◽  
Ismail Muhammad Khaidir
Keyword(s):  
Ambient Temperature ◽  
Electric Power ◽  
Leakage Current ◽  
Distribution System ◽  
Power Transmission ◽  
Current Data ◽  
Electric Power System ◽  
Leakage Currents ◽  
Ceramic Insulator ◽  
Distribution System Reliability

ABSTRAK Isolator merupakan komponen yang penting dijaga keandalannya dalam sistem transmisi dan distribusi tenaga listrik. Isolator rentan mengalami kegagalan akibat lingkungan, karena terpapar langsung kondisi dimana isolator tersebut terpasang. Salah satu jenis isolator yang sering digunakan adalah bahan keramik, dimana memiliki kelebihan diantaranya kekuatan mekanik yang cukup handal. Namun kekurangan isolator jenis ini adalah sifat permukaannya yang hidrofilik, yaitu mudah menyerap air sehingga bila digunakan pada kelembaban tinggi cenderung memicu timbulnya arus bocor. Arus bocor merupakan parameter penting pada isolator karena sering menjadi penyebab kegagalan isolator. Untuk mengetahui seberapa besar pengaruh kondisi lingkungan terhadap arus bocor, dilakukan pengujian terhadap isolator keramik dalam waktu 24 jam. Data arus bocor diambil setiap 3 jam untuk melihat perubahannya berdasarkan perubahan kelembaban, dan suhu lingkungan. Hasilnya didapat bahwa semakin tinggi kelembaban udara, dan semakin rendah suhu lingkungan maka arus bocor semakin tinggi. Hasil penelitian ini dapat dijadikan acuan untuk mengantisipasi kegagalan isolator keramik akibat arus bocor sehingga keandalan sistem tenaga listrik dapat terjaga. Kata kunci: Isolator keramik, Lingkungan, Kelembaban, Suhu. ABSTRACT Isolator is an important component that must be maintained to keep electric power transmission and distribution system reliability. Isolators are susceptible to failure due to the environment, because they are directly exposed to conditions where the insulator installed. Ceramic insulator is one type of isolator that is often used, which has advantages including mechanical strength that is quite reliable. However, the lack of this type of isolator is its hydrophilic surface, which is easy to absorb water so that when used at high humidity tends to trigger a leakage current. Leakage current is an important parameter in an insulator because it can be a cause due to insulator failure. To find out how environmental conditions impact on leakage currents along day, a ceramic isolator is tested within 24 hours. Leakage current data is taken every 3 hours to see the changes based on changes in humidity, and ambient temperature. The result is the higher humidity of the air, and the lower ambient temperature, can make insulator leakage current rise up. The results of this study can be used as a reference to anticipate the failure of ceramic insulators due to leakage currents so that the reliability of the electric power system can be maintained. Keywords: ceramic insulator, environtment, humidity, temperature.

Investigation of the Causes and Variation of Leakage Currents in Amorphous Silicon P-I-N Diodes

2003 ◽  
Vol 762 ◽  
Author(s):  
Todd R. Johnson ◽  
Gautam Ganguly ◽  
George S. Wood ◽  
David E. Carlson
Keyword(s):  
Zinc Oxide ◽  
Amorphous Silicon ◽  
Point Defects ◽  
Tin Oxide ◽  
Reverse Bias ◽  
Hydrogenated Amorphous Silicon ◽  
Cell Area ◽  
Leakage Currents ◽  
Single Junction ◽  
Hydrogenated Amorphous

AbstractExcess leakage currents under reverse bias (known as shunting) and spontaneous reductions of this excess leakage under increased reverse bias (known as curing) were investigated in hydrogenated amorphous silicon (a-Si:H) based single junction p-i-n type diodes. An increase in the frequency of shunting was observed when the front contacts were switched from tin oxide to zinc oxide, most likely due to defects in the previously deposited zinc oxide coated glass was observed. Storage in the dark and light soaking up to 100 hours were both observed to independently increase the leakage current in previously leaking diodes. Models for the distribution of shunt-causing defects within a given cell area were considered. Comparing the measured frequency of shunting using cells of varying area (1 to 16 mm2) to the models' predictions indicate a distribution of point defects separated by relatively large average distances that are slightly larger for tin oxide (5-6 mm) than for zinc oxide (4 mm).

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