scholarly journals Fundamentals of Mass Spectrometry -Secondary Ion Mass Spectrometry (SIMS), Cluster SIMS, and Electrospray Droplet Impact SIMS-

2010 ◽  
Vol 58 (5) ◽  
pp. 175-184 ◽  
Author(s):  
Kenzo HIRAOKA
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Droplet Impact ◽  
Ion Mass Spectrometry ◽  
Cluster Sims ◽  
Secondary Ion

scholarly journals Study on ion formation in electrospray droplet impact secondary ion mass spectrometry

2007 ◽  
Vol 21 (10) ◽  
pp. 1579-1586 ◽  
Author(s):  
Daiki Asakawa ◽  
Susumu Fujimaki ◽  
Yutaka Hashimoto ◽  
Kunihiko Mori ◽  
Kenzo Hiraoka
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Droplet Impact ◽  
Ion Formation ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Electrosprayed droplet impact/secondary ion mass spectrometry

2005 ◽  
Vol 38 (1) ◽  
pp. 225-229 ◽  
Author(s):  
K. Hiraoka ◽  
D. Asakawa ◽  
S. Fujimaki ◽  
A. Takamizawa ◽  
K. Mori
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Droplet Impact ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Electrospray droplet impact secondary ion mass spectrometry using a vacuum electrospray source

2015 ◽  
Vol 29 (15) ◽  
pp. 1420-1426 ◽  
Author(s):  
R. Takaishi ◽  
Y. Sakai ◽  
K. Hiraoka ◽  
H. Wada ◽  
S. Morita ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Droplet Impact ◽  
Ion Mass Spectrometry ◽  
Electrospray Source ◽  
Secondary Ion
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