Multi-Classifier Approaches for Post-Placement Surface-Mount Devices Quality Inspection
Stefanos Goumas
◽
Michalis Zervakis
J. D. Chauhan
◽
C. K. Modi
◽
K. J. Pithadiya
1997 ◽
Vol 63
(5)
◽
pp. 664-668
◽
Daizo TAKAOKA
◽
Akira SAKAGUCHI
◽
Yoshitoshi MORITA
◽
Makoto YAMADA
◽
Tomomi YAMAGUCHI
2007 ◽
Vol 3
(7)
◽
pp. 1044-1047
◽
Hyengcheul Choi
◽
D. S. Shin
◽
S. U. Park
◽
Hyeong Dong Kim