scholarly journals Asymptotic analysis of the transient response of a thermoelastic assembly involving a thin layer

2022 ◽  
Vol 350 (1) ◽  
pp. 27-45
Author(s):  
Christian Licht ◽  
Somsak Orankitjaroen ◽  
Thibaut Weller
Keyword(s):  
Asymptotic Analysis ◽  
Thin Layer ◽  
Transient Response

The effect of normal blowing on the flow near a rotating disk of infinite extent

1971 ◽  
Vol 47 (4) ◽  
pp. 789-798 ◽  
Author(s):  
H. K. Kuiken
Keyword(s):  
Asymptotic Analysis ◽  
Thin Layer ◽  
Rotating Disk ◽  
Complete Agreement ◽  
Viscous Effects ◽  
First Order ◽  
Numerical Integrations ◽  
Infinite Extent

The effect of blowing through a porous rotating disk on the flow induced by this disk is studied. For strong blowing the flow is almost wholly inviscid. First-order viscous effects are encountered only in a thin layer at some distance from the disk. The results of an asymptotic analysis are compared with numerical integrations of the full equations and complete agreement is found.

scholarly journals Asymptotic Analysis for Domains Separated by a Thin Layer Made of Periodic Vertical Beams

2017 ◽  
Vol 128 (2) ◽  
pp. 291-331 ◽  
Author(s):  
Georges Griso ◽  
Anastasia Migunova ◽  
Julia Orlik
Keyword(s):  
Asymptotic Analysis ◽  
Thin Layer

scholarly journals APPROXIMATE TRANSMISSION CONDITIONS FOR A POISSON PROBLEM AT MID-DIFFUSION

2015 ◽  
Vol 20 (1) ◽  
pp. 53-75 ◽  
Author(s):  
Khaled El-Ghaouti Boutarene
Keyword(s):  
Asymptotic Expansion ◽  
Asymptotic Analysis ◽  
Error Estimate ◽  
Thin Layer ◽  
Finite Number ◽  
Bounded Domain ◽  
Poisson Equation ◽  
Transmission Conditions ◽  
Variational Equations ◽  
Poisson Problem

This work consists in the asymptotic analysis of the solution of Poisson equation in a bounded domain of RP(P = 2, 3) with a thin layer. We use a method based on hierarchical variational equations to derive an explicitly asymptotic expansion of the solution with respect to the thickness of the thin layer. We determine the first two terms of the expansion and prove the error estimate made by truncating the expansion after a finite number of terms. Next, using the first two terms of the asymptotic expansion, we show that we can model the effect of the thin layer by a problem with transmission conditions of order two.

Applications of Photoelectron Microscopy

1976 ◽  
Vol 34 ◽  
pp. 506-507
Author(s):  
William J. Baxter
Keyword(s):  
Electron Microscopy ◽  
Thermal Decomposition ◽  
Chemical Composition ◽  
Ultraviolet Radiation ◽  
Thin Layer ◽  
Edge Effects ◽  
Electron Optics ◽  
Surface Layers ◽  
Crystalline Orientation ◽  
Fluorescent Screen

In this form of electron microscopy, photoelectrons emitted from a metal by ultraviolet radiation are accelerated and imaged onto a fluorescent screen by conventional electron optics. image contrast is determined by spatial variations in the intensity of the photoemission. The dominant source of contrast is due to changes in the photoelectric work function, between surfaces of different crystalline orientation, or different chemical composition. Topographical variations produce a relatively weak contrast due to shadowing and edge effects.Since the photoelectrons originate from the surface layers (e.g. ∼5-10 nm for metals), photoelectron microscopy is surface sensitive. Thus to see the microstructure of a metal the thin layer (∼3 nm) of surface oxide must be removed, either by ion bombardment or by thermal decomposition in the vacuum of the microscope.

Sign in / Sign up

Export Citation Format

Share Document