Development of Automatic Temperature Control Module for Semiconductor Test Process Using Thermoelectric Element

Author(s):  
Deuk-soo Son ◽  
Seon-Hee Dong ◽  
Woo-Young Lee
Metallurg ◽  
2021 ◽  
pp. 42-50
Author(s):  
O.A. Khrebtova ◽  
A.A. Shapoval ◽  
D.V. Mos’pan ◽  
V.V. Dragobetsky ◽  
S.M. Gorbatyuk ◽  
...  

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