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X-ray in situ observation of graphene precipitating directly on sapphire substrate with and without Ti capping layer

2020 ◽  
Vol 549 ◽  
pp. 125861
Author(s):  
Shigeya Naritsuka ◽  
Jumpei Yamada ◽  
Yuki Ueda ◽  
Asato Nakashima ◽  
Tatsuya Kashio ◽  
...  
Keyword(s):  
Sapphire Substrate ◽  
In Situ Observation ◽  
Capping Layer ◽  
X Ray ◽  
Ti Capping Layer

The Role of Ti Capping Layer in HfOx-Based RRAM Devices

2014 ◽  
Vol 35 (9) ◽  
pp. 912-914 ◽  
Author(s):  
Zheng Fang ◽  
Xin Peng Wang ◽  
Joon Sohn ◽  
Bao Bin Weng ◽  
Zhi Ping Zhang ◽  
...  
Keyword(s):  
Capping Layer ◽  
Ti Capping Layer

Low Resistive and Uniform CoSi[sub 2] Formation with Ti Capping Layer

2011 ◽  
Author(s):  
Jaesang Lee ◽  
Hyungchul Kim ◽  
Sanghyun Woo ◽  
Hyerin Lee ◽  
Hyeongtag Jeon ◽  
...  
Keyword(s):  
Capping Layer ◽  
Ti Capping Layer

Annealing effects on microstructures of HfAlO/Si with a Ti capping layer

2009 ◽  
Vol 48 (2) ◽  
pp. 20302 ◽  
Author(s):  
L. Wan ◽  
X. Gong ◽  
X. H. Cheng ◽  
H. Luo ◽  
Y. Huang ◽  
...  
Keyword(s):  
Capping Layer ◽  
Annealing Effects ◽  
Ti Capping Layer

Lower-temperature crystallization of CoFeB in MgO magnetic tunnel junctions by using Ti capping layer

2009 ◽  
Vol 94 (6) ◽  
pp. 062509 ◽  
Author(s):  
Takahiro Ibusuki ◽  
Toyoo Miyajima ◽  
Shinjiro Umehara ◽  
Shin Eguchi ◽  
Masashige Sato
Keyword(s):  
Tunnel Junctions ◽  
Magnetic Tunnel Junctions ◽  
Capping Layer ◽  
Lower Temperature ◽  
Temperature Crystallization ◽  
Ti Capping Layer

Engineering of interfacial layer between HfAl2O5 dielectric film and Si with a Ti-capping layer

2008 ◽  
Vol 517 (1) ◽  
pp. 462-464
Author(s):  
Xinhong Cheng ◽  
Zhaorui Song ◽  
Yumei Xing ◽  
Yuehui Yu ◽  
Dashen Shen
Keyword(s):  
Interfacial Layer ◽  
Dielectric Film ◽  
Capping Layer ◽  
Ti Capping Layer

Interfacial structures and electrical properties of HfAl2O5 gate dielectric film annealed with a Ti capping layer

2007 ◽  
Vol 90 (15) ◽  
pp. 152910 ◽  
Author(s):  
Xinhong Cheng ◽  
Li Wan ◽  
Zhaorui Song ◽  
Yuehui Yu ◽  
DaShen Shen
Keyword(s):  
Electrical Properties ◽  
Gate Dielectric ◽  
Dielectric Film ◽  
Capping Layer ◽  
Interfacial Structures ◽  
Ti Capping Layer

Properties of Carbon Nanotubes Via a Thin Ti Capping Layer on the Pretreated Catalyst

2007 ◽  
Vol 154 (3) ◽  
pp. J109 ◽  
Author(s):  
Rui-Ling Lai ◽  
Jiun-Kai Shiu ◽  
Yao-Ren Chang ◽  
Kao-Chao Lin ◽  
Pei-Chi Chang ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Capping Layer ◽  
Ti Capping Layer
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