exact analytic solution
Recently Published Documents


TOTAL DOCUMENTS

50
(FIVE YEARS 3)

H-INDEX

11
(FIVE YEARS 1)

2021 ◽  
Vol 923 (2) ◽  
pp. 280
Author(s):  
Francis P. Wilkin ◽  
Harry Hausner




New Astronomy ◽  
2021 ◽  
Vol 82 ◽  
pp. 101458 ◽  
Author(s):  
Rafael Torres-Córdoba ◽  
Edgar A. Martínez-García


2020 ◽  
Vol 30 (7) ◽  
pp. 073112 ◽  
Author(s):  
Ned J. Corron ◽  
Seth D. Cohen ◽  
Aubrey N. Beal ◽  
Jonathan N. Blakely


Crystals ◽  
2019 ◽  
Vol 9 (10) ◽  
pp. 542 ◽  
Author(s):  
Vladimir A. Belyakov ◽  
Sergei V. Semenov

Most studies of the localized edge (EM) and defect (DM) modes in cholesteric liquid crystals (CLC) are related to the localized modes in a collinear geometry, i.e., for the case of light propagation along the spiral axis. It is due to the fact that all photonic effects in CLC are most pronounced just for a collinear geometry, and also partially due to the fact that a simple exact analytic solution of the Maxwell equations is known for a collinear geometry, whereas for a non-collinear geometry, there is no exact analytic solution of the Maxwell equations and a theoretical description of the experimental data becomes more complicated. It is why in papers related to the localized modes in CLC for a non-collinear geometry and observing phenomena similar to the case of a collinear geometry, their interpretation is not so clear. Recently, an analytical theory of the conical modes (CEM) related to a first order of light diffraction was developed in the framework of the two-wave dynamic diffraction theory approximation ensuring the results accuracy of order of δ, the CLC dielectric anisotropy. The corresponding experimental results are reasonably well described by this theory, however, some numerical problems related to the CEM polarization properties remain. In the present paper, an analytical theory of a second order diffraction CEM is presented with results that are qualitatively similar to the results for a first order diffraction order CEM and have the accuracy of order of δ2, i.e., practically exact. In particular, second order diffraction CEM polarization properties are related to the linear σ and π polarizations. The known experimental results on the CEM are discussed and optimal conditions for the second order diffraction CEM observations are formulated.





2017 ◽  
Vol 844 (1) ◽  
pp. 29 ◽  
Author(s):  
Francis P. Wilkin ◽  
Harry Hausner


2016 ◽  
Vol 26 (8) ◽  
pp. 2432-2440 ◽  
Author(s):  
Lazhar Bougoffa ◽  
Jun-Sheng Duan ◽  
Randolph Rach

Purpose The purpose of this paper is to first deduce a new form of the exact analytic solution of the well-known nonlinear second-order differential equation subject to a set of mixed nonlinear Robin and Neumann boundary conditions that model the thin film flows of fourth-grade fluids, and second to compare the approximate analytic solutions by the Adomian decomposition method (ADM) with the new exact analytic solution to validate its accuracy for parametric simulations of the thin film fluid flows, even for more complex models of non-Newtonian fluids in industrial applications. Design/methodology/approach The approach to calculating a new form of the exact analytic solution of thin film fluid flows rests upon a sequence of transformations including the modification of the classic technique due to Scipione del Ferro and Niccolò Fontana Tartaglia. Next the authors establish a lemma that justifies the new expression of the exact analytic solution for thin film fluid flows of fourth-grade fluids. Second, the authors apply a modification of the systematic ADM to quickly and easily calculate the sequence of analytic approximate solutions for this strongly nonlinear model of thin film flow of fourth-grade fluids. The ADM has been previously demonstrated to be eminently practical with widespread applicability to frontier problems arising in scientific and engineering applications. Herein, the authors seek to establish the relative merits of the ADM in the context of the thin film flows of fourth-grade fluids. Findings The ADM is shown to closely agree with the new expression of the exact analytic solution. The authors have calculated the error remainder functions and the maximal error remainder parameters in the error analysis to corroborate the solutions. The error analysis demonstrates the rapid rate of convergence and that we can approximate the exact solution as closely as we please; furthermore the rate of convergence is shown to be approximately exponential, and thus only a low-stage approximation will be adequate for engineering simulations as previously documented in the literature. Originality/value This paper presents an accurate work for solving thin film flows of fourth-grade fluids. The authors have compared the approximate analytic solutions by the ADM with the new expression of the exact analytic solution for this strongly nonlinear model. The authors commend this technique for more complex thin film fluid flow models.



Sign in / Sign up

Export Citation Format

Share Document