Gizopoulos / Advances in ElectronicTesting - Frontiers in Electronic Testing
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Published By Springer US

9780387294087, 9780387294094

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Embedded Cores and System-on-Chip Testing

Gizopoulos / Advances in ElectronicTesting - Frontiers in Electronic Testing ◽

10.1007/0-387-29409-0_7 ◽

2006 ◽

pp. 217-261 ◽

Cited By ~ 2

Author(s):

Rubin Parekhji

Keyword(s):

System On Chip ◽

Embedded Cores ◽

Chip Testing ◽

On Chip

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Silicon Debug

Gizopoulos / Advances in ElectronicTesting - Frontiers in Electronic Testing ◽

10.1007/0-387-29409-0_3 ◽

2006 ◽

pp. 77-108 ◽

Cited By ~ 3

Author(s):

Doug Josephson ◽

Bob Gottlieb

Keyword(s):

Silicon Debug

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Loaded Board Testing

Gizopoulos / Advances in ElectronicTesting - Frontiers in Electronic Testing ◽

10.1007/0-387-29409-0_11 ◽

2006 ◽

pp. 371-406

Author(s):

Kenneth P Parker

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Mixed-Signal Testing and DfT

Gizopoulos / Advances in ElectronicTesting - Frontiers in Electronic Testing ◽

10.1007/0-387-29409-0_9 ◽

2006 ◽

pp. 301-336 ◽

Cited By ~ 4

Author(s):

Stephen Sunter

Keyword(s):

Mixed Signal ◽

Mixed Signal Testing

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Delay Testing

Gizopoulos / Advances in ElectronicTesting - Frontiers in Electronic Testing ◽

10.1007/0-387-29409-0_4 ◽

2006 ◽

pp. 109-139

Author(s):

Adam Cron

Keyword(s):

Delay Testing

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Embedded MemoryTesting

Gizopoulos / Advances in ElectronicTesting - Frontiers in Electronic Testing ◽

10.1007/0-387-29409-0_8 ◽

2006 ◽

pp. 263-300 ◽

Cited By ~ 1

Author(s):

R Dean Adams

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DFT_Oriented,Low-Cost Testers

Gizopoulos / Advances in ElectronicTesting - Frontiers in Electronic Testing ◽

10.1007/0-387-29409-0_6 ◽

2006 ◽

pp. 179-216 ◽

Cited By ~ 1

Author(s):

Al Coruch ◽

Geir Eide

Keyword(s):

Low Cost

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Defect-Orinted Testing

Gizopoulos / Advances in ElectronicTesting - Frontiers in Electronic Testing ◽

10.1007/0-387-29409-0_1 ◽

2006 ◽

pp. 1-42 ◽

Cited By ~ 4

Author(s):

Robert C Aitken

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RF Testing

Gizopoulos / Advances in ElectronicTesting - Frontiers in Electronic Testing ◽

10.1007/0-387-29409-0_10 ◽

2006 ◽

pp. 337-369

Author(s):

Randy Wolf ◽

Mustapha Slamani ◽

John Ferrario ◽

Jayendra Bhagat

Keyword(s):

Rf Testing

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Failure Mechanisms and Testing in Nanometer Technologies

Gizopoulos / Advances in ElectronicTesting - Frontiers in Electronic Testing ◽

10.1007/0-387-29409-0_2 ◽

2006 ◽

pp. 43-75 ◽

Cited By ~ 1

Author(s):

Jaume Segura ◽

Charles Hawkins ◽

Jerry Soden

Keyword(s):

Failure Mechanisms

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Gizopoulos / Advances in ElectronicTesting - Frontiers in Electronic TestingLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer US

Embedded Cores and System-on-Chip Testing

Silicon Debug

Loaded Board Testing

Mixed-Signal Testing and DfT

Delay Testing

Embedded MemoryTesting

DFT_Oriented,Low-Cost Testers

Defect-Orinted Testing

RF Testing

Failure Mechanisms and Testing in Nanometer Technologies

Gizopoulos / Advances in ElectronicTesting - Frontiers in Electronic Testing
Latest Publications