2018 International Integrated Reliability Workshop (IIRW)
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41
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2
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Published By IEEE

9781538660393
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Improved PBTI reliability in junction-less nFET fabricated at low thermal budget for 3D Sequential Integration

2018 ◽  
Author(s):  
Zhicheng Wu ◽  
Jacopo Franco ◽  
Anne Vandooren ◽  
Ben Kaczer ◽  
Philippe Roussel ◽  
...  
Keyword(s):  
Thermal Budget ◽  
Low Thermal Budget

New Electromigration Model and Its Potential Application on Degradation Simulation for FinFET SRAM

2018 ◽  
Author(s):  
Rui Zhang ◽  
Kexin Yang ◽  
Taizhi Liu ◽  
Linda Milor
Keyword(s):  
Potential Application

FDSOI Mosfet gate dielectric breakdown Vd dependancy

2018 ◽  
Author(s):  
Xavier Federspiel ◽  
Mustapha Rafik ◽  
Melissa Arabi ◽  
Antoine Cros ◽  
Florian Cacho
Keyword(s):  
Gate Dielectric ◽  
Dielectric Breakdown

scholarly journals Distribution Function Based Simulations of Hot-Carrier Degradation in Nanowire FETs

2018 ◽  
Author(s):  
Michiel Vandemaele ◽  
Ben Kaczer ◽  
Zlatan Stanojevic ◽  
Stanislav Tyaginov ◽  
Alexander Makarov ◽  
...  
Keyword(s):  
Distribution Function ◽  
Hot Carrier ◽  
Hot Carrier Degradation

New Insights on device level TDDB at GHz speed in advanced CMOS nodes

2018 ◽  
Author(s):  
M. Arabi ◽  
X. Federspiel ◽  
F. Cacho ◽  
M. Rafik ◽  
A-P. Nguyen ◽  
...  

Self-Heating Effects on Hot Carrier Degradation and its Impact on Ring-Oscillator Reliability

2018 ◽  
Author(s):  
P. Paliwoda ◽  
Z. Chbili ◽  
A. Kerber ◽  
T. Nigam ◽  
D. Singh ◽  
...  
Keyword(s):  
Ring Oscillator ◽  
Hot Carrier ◽  
Self Heating ◽  
Heating Effects ◽  
Hot Carrier Degradation

Investigation of the effects of Pulsed Direct Current at low frequencies on the Electromigration Lifetime : Student Paper

2018 ◽  
Author(s):  
Jennifer M. Passage ◽  
Sophia Rogalskyj ◽  
Nabihah Azhari ◽  
Eric Wilcox ◽  
J.R. Lloyd
Keyword(s):  
Direct Current ◽  
Low Frequencies ◽  
Student Paper ◽  
Electromigration Lifetime ◽  
Pulsed Direct Current
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