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hot carrier degradation
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TOTAL DOCUMENTS
602
(FIVE YEARS 65)
H-INDEX
32
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Latest Documents
Most Cited Documents
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Anomalous NMOSFET hot carrier degradation on DRAM
10.1109/icta53157.2021.9661707
◽
2021
◽
Author(s):
Faxian Shan
◽
Yang Xiong
◽
Changching Chen
◽
Haibo Chen
◽
James Cho
◽
...
Keyword(s):
Hot Carrier
◽
Hot Carrier Degradation
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Comparison of the Hot Carrier Degradation of N- and P-Type Fin Field-Effect Transistors in 14-nm Technology Nodes
IEEE Electron Device Letters
◽
10.1109/led.2021.3106540
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2021
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Vol 42
(10)
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pp. 1420-1423
Author(s):
Fong-Min Ciou
◽
Jia-Hong Lin
◽
Po-Hsun Chen
◽
Ting-Chang Chang
◽
Kai-Chun Chang
◽
...
Keyword(s):
Field Effect
◽
Field Effect Transistors
◽
Hot Carrier
◽
P Type
◽
Technology Nodes
◽
Hot Carrier Degradation
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Comparison of DC/AC Hot Carrier Degradation between Short Channel Si Bulk and SiGe SOI p-FinFETs
10.1109/ipfa53173.2021.9617433
◽
2021
◽
Author(s):
Hao Chang
◽
Yongkui Zhang
◽
Longda Zhou
◽
Zhigang Ji
◽
Hong Yang
◽
...
Keyword(s):
Short Channel
◽
Hot Carrier
◽
Hot Carrier Degradation
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Impact of Hot Carrier Degradation on the Performances of Current Mirrors based on a 55 nm BiCMOS Integrated Circuit Technology
10.1109/essderc53440.2021.9631828
◽
2021
◽
Author(s):
C. Mukherjee
◽
M. Couret
◽
C. Maneux
◽
D. Celi
Keyword(s):
Integrated Circuit
◽
Hot Carrier
◽
Current Mirrors
◽
Circuit Technology
◽
Hot Carrier Degradation
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The impact of self-heating and its implications on hot-carrier degradation – A modeling study
Microelectronics Reliability
◽
10.1016/j.microrel.2021.114156
◽
2021
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Vol 122
◽
pp. 114156
Author(s):
S. Tyaginov
◽
A. Makarov
◽
A. Chasin
◽
E. Bury
◽
M. Vandemaele
◽
...
Keyword(s):
Hot Carrier
◽
Self Heating
◽
The Impact
◽
Modeling Study
◽
Hot Carrier Degradation
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Impact of Hot Carrier Degradation on DC and RF Performance of 45-nm Power Amplifier Cell
2021 IEEE Latin America Electron Devices Conference (LAEDC)
◽
10.1109/laedc51812.2021.9437956
◽
2021
◽
Author(s):
Aarti Rathi
◽
Purushothman Srinivasan
◽
Fernando Guarin
◽
Abhisek Dixit
Keyword(s):
Power Amplifier
◽
Hot Carrier
◽
Rf Performance
◽
Hot Carrier Degradation
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Channel-hot-carrier degradation in the channel of junctionless transistors: a device- and circuit-level perspective
Journal of Computational Electronics
◽
10.1007/s10825-021-01688-6
◽
2021
◽
Author(s):
Meena Panchore
◽
Lokesh Bramhane
◽
Jawar Singh
Keyword(s):
Hot Carrier
◽
Junctionless Transistors
◽
Hot Carrier Degradation
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Study of Anomalous Hot-Carrier Degradation of NMOS Transistor with 3D-NAND Hydrogen-Rich Process
2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
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10.1109/edtm50988.2021.9420842
◽
2021
◽
Author(s):
Chao Sun
◽
Wu Tian
◽
JianPing Wang
◽
Wenshan Xu
◽
Can Zhong
◽
...
Keyword(s):
Nmos Transistor
◽
Hot Carrier
◽
Hot Carrier Degradation
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Hot carrier Degradation in Classical and Emerging Logic and Power Electronic Devices: Rethinking Reliability for Next-Generation Electronics
2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
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10.1109/edtm50988.2021.9421019
◽
2021
◽
Author(s):
Muhammad Ashraful Alam
◽
Bikram Kishore Mahajan
◽
Yen-Pu Cheri
Keyword(s):
Electronic Devices
◽
Power Electronic
◽
Next Generation
◽
Hot Carrier
◽
Hot Carrier Degradation
Download Full-text
Localizing Hot-Carrier Degradation in Silicon Trench MOSFETs
IEEE Transactions on Electron Devices
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10.1109/ted.2021.3060697
◽
2021
◽
Vol 68
(4)
◽
pp. 1804-1809
Author(s):
Bernhard Ruch
◽
Gregor Pobegen
◽
Tibor Grasser
Keyword(s):
Hot Carrier
◽
Hot Carrier Degradation
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