Applied Optical Metrology III
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Published By SPIE

9781510628977, 9781510628984
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Recent development in BTDF/BRDF metrology on large-scale Lambertian-like diffusers: application to on-board calibration units in space instrumentation

2019 ◽  
Author(s):  
Emmanuel Mazy ◽  
Céline Michel ◽  
Sarah Marcotte ◽  
Lionel Clermont ◽  
Benoît Marquet ◽  
...  
Keyword(s):  
Large Scale ◽  
Space Instrumentation

Close-range image stitching based on depth information and moving DLT

2019 ◽  
Author(s):  
Mowen Xue ◽  
Xudong Li ◽  
Hongzhi Jiang ◽  
Huijie Zhao
Keyword(s):  
Depth Information ◽  
Image Stitching ◽  
Range Image ◽  
Close Range

Point spread function measurement for projector based on Fourier single-pixel imaging

2019 ◽  
Author(s):  
Ruotong Wu ◽  
Hongzhi Jiang ◽  
Huijie Zhao ◽  
Xudong Li ◽  
Qi Guo
Keyword(s):  
Point Spread Function ◽  
Function Measurement ◽  
Point Spread ◽  
Spread Function ◽  
Single Pixel

Comparison of interferometer and d’nanoimager for profiling large objects (Conference Presentation)

2019 ◽  
Author(s):  
Dingfu Chen ◽  
Yingjie Yu ◽  
Jianfei Sun ◽  
Prathan Buranasiri ◽  
Sutha Sutthiruangwong ◽  
...  

Combining multispectral and hyperspectral imaging techniques to monitor and manage wax apple orchard (Conference Presentation)

2019 ◽  
Author(s):  
Yi-Chun Chen ◽  
Bo-Yan Lai ◽  
Ku-Yu Chen ◽  
Chi Cho Huang ◽  
Yung-Jhe Yan ◽  
...  
Keyword(s):  
Hyperspectral Imaging ◽  
Imaging Techniques ◽  
Apple Orchard
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