Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270)
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TOTAL DOCUMENTS

162

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Scaling Deeper to Submicron: On-Line Testing to the Rescue

Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) ◽

10.1109/test.1998.743330 ◽

2005 ◽

Cited By ~ 12

Author(s):

M. Nicolaidis

Keyword(s):

On Line

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Switch-level bridging fault simulation in the presence of feedbacks

Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) ◽

10.1109/test.1998.743175 ◽

2002 ◽

Cited By ~ 6

Author(s):

P. Dahlgren

Keyword(s):

Fault Simulation ◽

Bridging Fault

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When two worlds merge [test issues for system-level ICs]

Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) ◽

10.1109/test.1998.743323 ◽

2002 ◽

Author(s):

K. Lanier

Keyword(s):

System Level

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Quad DCVS dynamic logic fault modeling and testing

Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) ◽

10.1109/test.1998.743174 ◽

2002 ◽

Cited By ~ 4

Author(s):

R.D. Adams ◽

E.S. Cooley ◽

P.R. Hansen

Keyword(s):

Dynamic Logic ◽

Fault Modeling

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BETSY: synthesizing circuits for a specified BIST environment

Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) ◽

10.1109/test.1998.743147 ◽

2002 ◽

Cited By ~ 4

Author(s):

Zhe Zhao ◽

B. Pouya ◽

N.A. Touba

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Fine pitch (45 micron) P4 probing

Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) ◽

10.1109/test.1998.743163 ◽

2002 ◽

Author(s):

T. Ishii ◽

H. Yoshida

Keyword(s):

Fine Pitch

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Boundary scan BIST methodology for reconfigurable systems

Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) ◽

10.1109/test.1998.743260 ◽

2002 ◽

Cited By ~ 1

Author(s):

Chauchin Su ◽

Shung-Won Jeng ◽

Yue-Tsang Chen

Keyword(s):

Reconfigurable Systems ◽

Boundary Scan

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Limited access testing: IEEE 1149.4-instrumentation and methods

Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) ◽

10.1109/test.1998.743178 ◽

2002 ◽

Cited By ~ 9

Author(s):

J. McDermid

Keyword(s):

Limited Access

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A comprehensive approach to the partial scan problem using implicit state enumeration

Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) ◽

10.1109/test.1998.743209 ◽

2002 ◽

Cited By ~ 7

Author(s):

P. Kalla ◽

M.J. Ciesielski

Keyword(s):

Comprehensive Approach ◽

Partial Scan ◽

State Enumeration

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System chip test: are we there yet?

Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) ◽

10.1109/test.1998.743344 ◽

2002 ◽

Cited By ~ 3

Author(s):

P. Varma

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Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Int. Test Conference

Scaling Deeper to Submicron: On-Line Testing to the Rescue

Switch-level bridging fault simulation in the presence of feedbacks

When two worlds merge [test issues for system-level ICs]

Quad DCVS dynamic logic fault modeling and testing

BETSY: synthesizing circuits for a specified BIST environment

Fine pitch (45 micron) P4 probing

Boundary scan BIST methodology for reconfigurable systems

Limited access testing: IEEE 1149.4-instrumentation and methods

A comprehensive approach to the partial scan problem using implicit state enumeration

System chip test: are we there yet?

Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270)
Latest Publications