Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270)
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Scaling Deeper to Submicron: On-Line Testing to the Rescue

Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) ◽

10.1109/test.1998.743330 ◽

2005 ◽

Author(s):

M. Nicolaidis

Keyword(s):

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Fine pitch (45 micron) P4 probing

Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) ◽

10.1109/test.1998.743163 ◽

2002 ◽

Author(s):

T. Ishii ◽

H. Yoshida

Keyword(s):

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Boundary scan BIST methodology for reconfigurable systems

Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) ◽

10.1109/test.1998.743260 ◽

2002 ◽

Author(s):

Chauchin Su ◽

Shung-Won Jeng ◽

Yue-Tsang Chen

Keyword(s):

Reconfigurable Systems ◽

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Limited access testing: IEEE 1149.4-instrumentation and methods

Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) ◽

10.1109/test.1998.743178 ◽

2002 ◽

Author(s):

J. McDermid

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Quad DCVS dynamic logic fault modeling and testing

Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) ◽

10.1109/test.1998.743174 ◽

2002 ◽

Author(s):

R.D. Adams ◽

E.S. Cooley ◽

P.R. Hansen

Keyword(s):

Dynamic Logic ◽

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BETSY: synthesizing circuits for a specified BIST environment

Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) ◽

10.1109/test.1998.743147 ◽

2002 ◽

Author(s):

Zhe Zhao ◽

B. Pouya ◽

N.A. Touba

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Switch-level bridging fault simulation in the presence of feedbacks

Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) ◽

10.1109/test.1998.743175 ◽

2002 ◽

Author(s):

P. Dahlgren

Keyword(s):

Fault Simulation ◽

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When two worlds merge [test issues for system-level ICs]

Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) ◽

10.1109/test.1998.743323 ◽

2002 ◽

Author(s):

K. Lanier

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Process-tolerant test with energy consumption ratio

Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) ◽

10.1109/test.1998.743300 ◽

2002 ◽

Author(s):

B. Vinnakota ◽

Wanli Jiang ◽

Dechang Sun

Keyword(s):

Energy Consumption ◽

Consumption Ratio ◽

Energy Consumption Ratio

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Diagnostic techniques for the UltraSPARC/sup TM/ microprocessors

Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) ◽

10.1109/test.1998.743189 ◽

2002 ◽

Author(s):

A. Kinra ◽

A. Mehta ◽

N. Smith ◽

J. Mitchell ◽

F. Valente

Keyword(s):

Diagnostic Techniques

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