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Optical Microlithography XXXIV
Latest Publications
TOTAL DOCUMENTS
34
(FIVE YEARS 34)
H-INDEX
0
(FIVE YEARS 0)
Published By SPIE
9781510640597, 9781510640603
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Latest Documents
Most Cited Documents
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Front Matter: Volume 11613
Optical Microlithography XXXIV
◽
10.1117/12.2595824
◽
2021
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Keyword(s):
Matter Volume
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Lithography’s endgame: the last wavelength and Moore’s Law 2.0
Optical Microlithography XXXIV
◽
10.1117/12.2596403
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2021
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Author(s):
Ralph R. Dammel
Keyword(s):
Moore’S Law
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Moore's Law
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Effective data sampling techniques for machine learning OPC in full chip production
Optical Microlithography XXXIV
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10.1117/12.2586176
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2021
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Author(s):
Hesham Abdelghany
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Kevin Hooker
Keyword(s):
Machine Learning
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Sampling Techniques
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Data Sampling
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Optimization of accurate resist kernels through convolutional neural network
Optical Microlithography XXXIV
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10.1117/12.2583599
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2021
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Author(s):
Yonghwi Kwon
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Youngsoo Shin
Keyword(s):
Neural Network
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Convolutional Neural Network
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Full chip computational lithography for KrF multi-focal imaging (MFI) (Conference Presentation)
Optical Microlithography XXXIV
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10.1117/12.2585651
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2021
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Author(s):
Will Conley
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Vince Plachecki
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Stephen Hsu
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Michael Crouse
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Rongkuo Zhao
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...
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New scaling enablers in computational lithography
Optical Microlithography XXXIV
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10.1117/12.2589319
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2021
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Author(s):
Kunal N. Taravade
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Recent developments and concepts in optical exposure technology
Optical Microlithography XXXIV
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10.1117/12.2589151
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2021
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Author(s):
Donis G. Flagello
Keyword(s):
Recent Developments
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Advanced spectral engineering: a new way of process improvements by laser spectra optimization for optical lithography
Optical Microlithography XXXIV
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10.1117/12.2583670
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2021
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Author(s):
Koichi Fujii
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Takahito Kumazaki
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Takamitsu Komaki
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Toshihiro Oga
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Taku Yamazaki
Keyword(s):
Optical Lithography
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Process Improvements
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Contour-based model calibration to a minimum number of patterns
Optical Microlithography XXXIV
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10.1117/12.2584714
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2021
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Author(s):
Bernd Küchler
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Francois Weisbuch
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Wolfgang Hoppe
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Jirka Schatz
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Martin Bohn
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...
Keyword(s):
Model Calibration
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Minimum Number
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Lithography layout classification based on graph convolution network
Optical Microlithography XXXIV
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10.1117/12.2583558
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2021
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Author(s):
Junbi Zhang
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Xu Ma
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Shengen Zhang
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Xianqiang Zheng
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Rui Chen
◽
...
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