2010 15th IEEE European Test Symposium
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72
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9781424458349
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

A multi-mode MEMS sensor design to support system test and health & usage monitoring applications

2010 ◽  
Author(s):  
Z. Xu ◽  
A. Richardson ◽  
L. Li ◽  
M. Begbie ◽  
D. Koltsov ◽  
...  
Keyword(s):  
Support System ◽  
Sensor Design ◽  
Mems Sensor ◽  
Monitoring Applications ◽  
Multi Mode

A diagnostic test generation system and a coverage metric

2010 ◽  
Author(s):  
Yu Zhang ◽  
Vishwani D. Agrawal
Keyword(s):  
Diagnostic Test ◽  
Test Generation ◽  
Generation System

Hybrid test application in hybrid delay scan design

2010 ◽  
Author(s):  
Yuki Yoshikawa ◽  
Tomomi Nuwa ◽  
Hideyuki Ichihara ◽  
Tomoo Inoue
Keyword(s):  
Scan Design ◽  
Test Application ◽  
Hybrid Test

Multiple fault diagnosis in crossbar nano-architectures

2010 ◽  
Author(s):  
Navid Farazmand ◽  
Mehdi B. Tahoori
Keyword(s):  
Fault Diagnosis ◽  
Multiple Fault ◽  
Multiple Fault Diagnosis

Add-on blocks and algorithms for improving stimulus compression

2010 ◽  
Author(s):  
Nader Alawadhi ◽  
Ozgur Sinanoglu ◽  
Mohammed Al-Mulla

On measurement uncertainty of ADC nonlinearities in oscillation-based test

2010 ◽  
Author(s):  
Peter Mrak ◽  
Anton Biasizzo ◽  
Franc Novak
Keyword(s):  
Measurement Uncertainty

Adaptive test directions

2010 ◽  
Author(s):  
Peter Maxwell
Keyword(s):  
Adaptive Test

Sensors for built-in alternate RF test

2010 ◽  
Author(s):  
Louay Abdallah ◽  
Haralampos-G. Stratigopoulos ◽  
Christophe Kelma ◽  
Salvador Mir
Keyword(s):  
Rf Test
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