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2010 15th IEEE European Test Symposium
Latest Publications
TOTAL DOCUMENTS
72
(FIVE YEARS 0)
H-INDEX
9
(FIVE YEARS 0)
Published By IEEE
9781424458349
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Latest Documents
Most Cited Documents
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A multi-mode MEMS sensor design to support system test and health & usage monitoring applications
2010 15th IEEE European Test Symposium
◽
10.1109/etsym.2010.5512728
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2010
◽
Author(s):
Z. Xu
◽
A. Richardson
◽
L. Li
◽
M. Begbie
◽
D. Koltsov
◽
...
Keyword(s):
Support System
◽
Sensor Design
◽
Mems Sensor
◽
Monitoring Applications
◽
Multi Mode
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A diagnostic test generation system and a coverage metric
2010 15th IEEE European Test Symposium
◽
10.1109/etsym.2010.5512739
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2010
◽
Cited By ~ 2
Author(s):
Yu Zhang
◽
Vishwani D. Agrawal
Keyword(s):
Diagnostic Test
◽
Test Generation
◽
Generation System
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New scan-based test strategy for a dependable many-core processor using a NoC as a Test Access Mechanism
2010 15th IEEE European Test Symposium
◽
10.1109/etsym.2010.5512748
◽
2010
◽
Cited By ~ 1
Author(s):
Xiao Zhang
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Hans G. Kerkhoff
◽
Bart Vermeulen
Keyword(s):
Test Strategy
◽
Test Access Mechanism
◽
Many Core
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Hybrid test application in hybrid delay scan design
2010 15th IEEE European Test Symposium
◽
10.1109/etsym.2010.5512744
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2010
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Author(s):
Yuki Yoshikawa
◽
Tomomi Nuwa
◽
Hideyuki Ichihara
◽
Tomoo Inoue
Keyword(s):
Scan Design
◽
Test Application
◽
Hybrid Test
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Multiple fault diagnosis in crossbar nano-architectures
2010 15th IEEE European Test Symposium
◽
10.1109/etsym.2010.5512774
◽
2010
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Cited By ~ 3
Author(s):
Navid Farazmand
◽
Mehdi B. Tahoori
Keyword(s):
Fault Diagnosis
◽
Multiple Fault
◽
Multiple Fault Diagnosis
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Add-on blocks and algorithms for improving stimulus compression
2010 15th IEEE European Test Symposium
◽
10.1109/etsym.2010.5512746
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2010
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Author(s):
Nader Alawadhi
◽
Ozgur Sinanoglu
◽
Mohammed Al-Mulla
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Novel built-in methodology for defect testing of capacitor oxide in SAR analog to digital converters for critical automotive applications
2010 15th IEEE European Test Symposium
◽
10.1109/etsym.2010.5512762
◽
2010
◽
Cited By ~ 1
Author(s):
V. Malandruccolo
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M. Ciappa
◽
W. Fichtner
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H. Rothleitner
Keyword(s):
Analog To Digital Converters
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Automotive Applications
◽
Analog To Digital
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On measurement uncertainty of ADC nonlinearities in oscillation-based test
2010 15th IEEE European Test Symposium
◽
10.1109/etsym.2010.5512750
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2010
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Author(s):
Peter Mrak
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Anton Biasizzo
◽
Franc Novak
Keyword(s):
Measurement Uncertainty
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Adaptive test directions
2010 15th IEEE European Test Symposium
◽
10.1109/etsym.2010.5512789
◽
2010
◽
Cited By ~ 6
Author(s):
Peter Maxwell
Keyword(s):
Adaptive Test
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Sensors for built-in alternate RF test
2010 15th IEEE European Test Symposium
◽
10.1109/etsym.2010.5512783
◽
2010
◽
Cited By ~ 33
Author(s):
Louay Abdallah
◽
Haralampos-G. Stratigopoulos
◽
Christophe Kelma
◽
Salvador Mir
Keyword(s):
Rf Test
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