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Testability Concepts for Digital ICs - Frontiers in Electronic Testing
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TOTAL DOCUMENTS
8
(FIVE YEARS 0)
H-INDEX
1
(FIVE YEARS 0)
Published By Springer US
9781461360049, 9781461523659
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Latest Documents
Most Cited Documents
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Related Sources
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Examples of Leaf-Macro Test Techniques
Testability Concepts for Digital ICs - Frontiers in Electronic Testing
◽
10.1007/978-1-4615-2365-9_4
◽
1995
◽
pp. 41-79
Author(s):
F. P. M. Beenker
◽
R. G. Bennetts
◽
A. P. Thijssen
Download Full-text
Scan Chain Routing with Minimal Test Application Time
Testability Concepts for Digital ICs - Frontiers in Electronic Testing
◽
10.1007/978-1-4615-2365-9_5
◽
1995
◽
pp. 81-105
Author(s):
F. P. M. Beenker
◽
R. G. Bennetts
◽
A. P. Thijssen
Keyword(s):
Application Time
◽
Test Application Time
◽
Test Application
◽
Scan Chain
Download Full-text
Macro Test: A Framework for Testable IC Design
Testability Concepts for Digital ICs - Frontiers in Electronic Testing
◽
10.1007/978-1-4615-2365-9_3
◽
1995
◽
pp. 19-40
Author(s):
F. P. M. Beenker
◽
R. G. Bennetts
◽
A. P. Thijssen
Keyword(s):
Ic Design
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Defect-Oriented Testing
Testability Concepts for Digital ICs - Frontiers in Electronic Testing
◽
10.1007/978-1-4615-2365-9_2
◽
1995
◽
pp. 9-17
Author(s):
F. P. M. Beenker
◽
R. G. Bennetts
◽
A. P. Thijssen
Download Full-text
Test Control Block Concepts
Testability Concepts for Digital ICs - Frontiers in Electronic Testing
◽
10.1007/978-1-4615-2365-9_6
◽
1995
◽
pp. 107-138
Author(s):
F. P. M. Beenker
◽
R. G. Bennetts
◽
A. P. Thijssen
Keyword(s):
Control Block
◽
Test Control
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Exploiting Parallelism in Leaf-Macro Access
Testability Concepts for Digital ICs - Frontiers in Electronic Testing
◽
10.1007/978-1-4615-2365-9_7
◽
1995
◽
pp. 139-169
Author(s):
F. P. M. Beenker
◽
R. G. Bennetts
◽
A. P. Thijssen
Download Full-text
Introduction
Testability Concepts for Digital ICs - Frontiers in Electronic Testing
◽
10.1007/978-1-4615-2365-9_1
◽
1995
◽
pp. 1-8
◽
Cited By ~ 1
Author(s):
F. P. M. Beenker
◽
R. G. Bennetts
◽
A. P. Thijssen
Download Full-text
Timing Aspects of CMOS VLSI Circuits
Testability Concepts for Digital ICs - Frontiers in Electronic Testing
◽
10.1007/978-1-4615-2365-9_8
◽
1995
◽
pp. 171-191
Author(s):
F. P. M. Beenker
◽
R. G. Bennetts
◽
A. P. Thijssen
Keyword(s):
Vlsi Circuits
◽
Cmos Vlsi
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