2016 IEEE 34th VLSI Test Symposium (VTS)
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67

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Published By IEEE

9781467384544

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

A novel technique for interdependent trim code optimization

2016 IEEE 34th VLSI Test Symposium (VTS) ◽

10.1109/vts.2016.7477261 ◽

2016 ◽

Cited By ~ 2

Author(s):

Pankaj Bongale ◽

Vinothkumar Sundaresan ◽

Partha Ghosh ◽

Rubin Parekhji

Keyword(s):

Code Optimization ◽

Novel Technique

Code-modulated embedded test for phased arrays

2016 IEEE 34th VLSI Test Symposium (VTS) ◽

10.1109/vts.2016.7477274 ◽

2016 ◽

Cited By ~ 2

Author(s):

Kevin Greene ◽

Vikas Chauhan ◽

Brian Floyd

Keyword(s):

Phased Arrays ◽

Embedded Test

Security of emerging non-volatile memories: Attacks and defenses

2016 IEEE 34th VLSI Test Symposium (VTS) ◽

10.1109/vts.2016.7477293 ◽

2016 ◽

Cited By ~ 8

Author(s):

Kaveh Shamsi ◽

Yier Jin

Keyword(s):

Attacks And Defenses

Process independent gain measurement with low overhead via BIST/DUT co-design

2016 IEEE 34th VLSI Test Symposium (VTS) ◽

10.1109/vts.2016.7477284 ◽

2016 ◽

Author(s):

Jae Woong Jeong ◽

Jennifer Kitchen ◽

Sule Ozev

Keyword(s):

Gain Measurement

Lifetime reliability modeling and estimation in multi-core systems

2016 IEEE 34th VLSI Test Symposium (VTS) ◽

10.1109/vts.2016.7477315 ◽

2016 ◽

Cited By ~ 2

Author(s):

Antonio Miele

Keyword(s):

Reliability Modeling ◽

Lifetime Reliability

Effective generation and evaluation of diagnostic SBST programs

2016 IEEE 34th VLSI Test Symposium (VTS) ◽

10.1109/vts.2016.7477279 ◽

2016 ◽

Cited By ~ 2

Author(s):

Andreas Riefert ◽

Riccardo Cantoro ◽

Matthias Sauer ◽

Matteo Sonza Reorda ◽

Bernd Becker

Keyword(s):

Effective Generation

Thermal issues in test: An overview of the significant aspects and industrial practice

2016 IEEE 34th VLSI Test Symposium (VTS) ◽

10.1109/vts.2016.7477278 ◽

2016 ◽

Cited By ~ 3

Author(s):

J. Alt ◽

P. Bernardi ◽

A. Bosio ◽

R. Cantoro ◽

H. Kerkhoff ◽

...

Keyword(s):

Industrial Practice

Test method and scheme for low-power validation in modern SOC integrated circuits

2016 IEEE 34th VLSI Test Symposium (VTS) ◽

10.1109/vts.2016.7477310 ◽

2016 ◽

Cited By ~ 3

Author(s):

Bonita Bhaskaran ◽

Amit Sanghani ◽

Kaushik Narayanun ◽

Ayub Abdollahian ◽

Amit Laknaur

Keyword(s):

Integrated Circuits ◽

Low Power ◽

Test Method

Microprocessor reliability-performance tradeoffs assessment at the microarchitecture level

2016 IEEE 34th VLSI Test Symposium (VTS) ◽

10.1109/vts.2016.7477300 ◽

2016 ◽

Cited By ~ 1

Author(s):

Sotiris Tselonis ◽

Manolis Kaliorakis ◽

Nikos Foutris ◽

George Papadimitriou ◽

Dimitris Gizopoulos

Keyword(s):

Reliability Performance ◽

Microprocessor Reliability

Accurate linearity testing with impure sinusoidal stimulus robust against flicker noise

2016 IEEE 34th VLSI Test Symposium (VTS) ◽

10.1109/vts.2016.7477296 ◽

2016 ◽

Cited By ~ 2

Author(s):

Yuming Zhuang ◽

Tao Chen ◽

Shravan Chaganti ◽

Degang Chen

Keyword(s):

Flicker Noise ◽

Sinusoidal Stimulus ◽

Linearity Testing