microprocessor reliability Latest Research Papers

2018 ◽

Vol 18 (1) ◽

pp. 70-79 ◽

Cited By ~ 10

Author(s):

Jorge A. Martinez ◽

Juan Antonio Maestro ◽

Pedro Reviriego

Keyword(s):

Soft Errors ◽

Instruction Set ◽

The Impact ◽

Microprocessor Reliability

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Register file criticality on embedded microprocessor reliability

2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) ◽

10.1109/radecs.2016.8093143 ◽

2016 ◽

Cited By ~ 2

Author(s):

Filipe M. Lins ◽

Lucas Tambara ◽

Fernanda L. Kastensmidt ◽

Paolo Rech

Keyword(s):

Register File ◽

Embedded Microprocessor ◽

Microprocessor Reliability

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System-Level Modeling of Microprocessor Reliability Degradation Due to Bias Temperature Instability and Hot Carrier Injection

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2016.2520658 ◽

2016 ◽

Vol 24 (8) ◽

pp. 2712-2725 ◽

Cited By ~ 15

Author(s):

Chang-Chih Chen ◽

Taizhi Liu ◽

Linda Milor

Keyword(s):

System Level ◽

Carrier Injection ◽

Temperature Instability ◽

Hot Carrier ◽

Bias Temperature Instability ◽

Hot Carrier Injection ◽

System Level Modeling ◽

Microprocessor Reliability

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Microprocessor reliability-performance tradeoffs assessment at the microarchitecture level

2016 IEEE 34th VLSI Test Symposium (VTS) ◽

10.1109/vts.2016.7477300 ◽

2016 ◽

Cited By ~ 1

Author(s):

Sotiris Tselonis ◽

Manolis Kaliorakis ◽

Nikos Foutris ◽

George Papadimitriou ◽

Dimitris Gizopoulos

Keyword(s):

Reliability Performance ◽

Microprocessor Reliability

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Analysis of AVF Evaluation Methods for Microprocessor Reliability

Signal Processing Research ◽

10.14355/spr.2015.04.008 ◽

2015 ◽

Vol 4 (0) ◽

pp. 48

Author(s):

Baolong Guo ◽

Guochang Zhou ◽

Cao Yufang ◽

Xiang Gao ◽

Yunyi Yan

Keyword(s):

Evaluation Methods ◽

Microprocessor Reliability

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System-level modeling of microprocessor reliability degradation due to TDDB

Design of Circuits and Integrated Systems ◽

10.1109/dcis.2014.7035568 ◽

2014 ◽

Cited By ~ 1

Author(s):

Chang-Chih Chen ◽

Soonyoung Cha ◽

Linda Milor

Keyword(s):

System Level ◽

System Level Modeling ◽

Microprocessor Reliability

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System-level modeling of microprocessor reliability degradation due to BTI and HCI

2014 IEEE International Reliability Physics Symposium ◽

10.1109/irps.2014.6861125 ◽

2014 ◽

Cited By ~ 16

Author(s):

Chang-Chih Chen ◽

Soonyoung Cha ◽

Taizhi Liu ◽

Linda Milor

Keyword(s):

System Level ◽

System Level Modeling ◽

Microprocessor Reliability

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System-Level Modeling and Microprocessor Reliability Analysis for Backend Wearout Mechanisms

Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013 ◽

10.7873/date.2013.328 ◽

2013 ◽

Cited By ~ 16

Author(s):

Chang-Chih Chen ◽

Linda Milor

Keyword(s):

Reliability Analysis ◽

System Level ◽

System Level Modeling ◽

Microprocessor Reliability

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Microprocessor reliability performance as a function of die location for a 0.25 μ, five layer metal CMOS logic process

1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296) ◽

10.1109/relphy.1999.761584 ◽

2003 ◽

Cited By ~ 16

Author(s):

W.C. Riordan ◽

R. Miller ◽

J.M. Sherman ◽

J. Hicks

Keyword(s):

Reliability Performance ◽

Logic Process ◽

Microprocessor Reliability

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microprocessor reliability
Recently Published Documents

TOTAL DOCUMENTS

H-INDEX

Evaluating the Impact of the Instruction Set on Microprocessor Reliability to Soft Errors

Register file criticality on embedded microprocessor reliability

System-Level Modeling of Microprocessor Reliability Degradation Due to Bias Temperature Instability and Hot Carrier Injection

Microprocessor reliability-performance tradeoffs assessment at the microarchitecture level

Analysis of AVF Evaluation Methods for Microprocessor Reliability

System-level modeling of microprocessor reliability degradation due to TDDB

System-level modeling of microprocessor reliability degradation due to BTI and HCI

System-Level Modeling and Microprocessor Reliability Analysis for Backend Wearout Mechanisms

Microprocessor reliability performance as a function of die location for a 0.25 μ, five layer metal CMOS logic process

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microprocessor reliabilityRecently Published Documents

TOTAL DOCUMENTS

H-INDEX

Evaluating the Impact of the Instruction Set on Microprocessor Reliability to Soft Errors

Register file criticality on embedded microprocessor reliability

System-Level Modeling of Microprocessor Reliability Degradation Due to Bias Temperature Instability and Hot Carrier Injection

Microprocessor reliability-performance tradeoffs assessment at the microarchitecture level

Analysis of AVF Evaluation Methods for Microprocessor Reliability

System-level modeling of microprocessor reliability degradation due to TDDB

System-level modeling of microprocessor reliability degradation due to BTI and HCI

System-Level Modeling and Microprocessor Reliability Analysis for Backend Wearout Mechanisms

Microprocessor reliability performance as a function of die location for a 0.25 μ, five layer metal CMOS logic process

microprocessor reliability
Recently Published Documents