Noncontact Atomic Force Microscopy - NanoScience and Technology
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Published By Springer Berlin Heidelberg

9783642014949, 9783642014956
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Cantilever Dynamics and Nonlinear Effects in Atomic Force Microscopy

2009 ◽  
pp. 361-395
Author(s):  
A. Raman ◽  
R. Reifenberger ◽  
J. Melcher ◽  
R. Tung
Keyword(s):  
Atomic Force Microscopy ◽  
Nonlinear Effects ◽  
Force Microscopy ◽  
Atomic Force

Principles and Applications of the qPlus Sensor

2009 ◽  
pp. 121-142 ◽  
Author(s):  
Franz J. Giessibl

Study of Thin Oxide Films with NC-AFM: Atomically Resolved Imaging and Beyond

2009 ◽  
pp. 143-167
Author(s):  
M. Heyde ◽  
G. H. Simon ◽  
T. König
Keyword(s):  
Oxide Films ◽  
Thin Oxide Films ◽  
Thin Oxide

Magnetic Exchange Force Microscopy

2009 ◽  
pp. 275-286
Author(s):  
Alexander Schwarz ◽  
Uwe Kaiser ◽  
Rene Schmidt ◽  
Roland Wiesendanger
Keyword(s):  
Exchange Force ◽  
Magnetic Exchange ◽  
Force Microscopy

Force Field Spectroscopy in Three Dimensions

2009 ◽  
pp. 95-119 ◽  
Author(s):  
André Schirmeisen ◽  
Hendrik Hölscher ◽  
Udo D. Schwarz
Keyword(s):  
Force Field ◽  
Three Dimensions ◽  
Field Spectroscopy

Atomic Manipulation on Metal Surfaces

2009 ◽  
pp. 191-215
Author(s):  
Markus Ternes ◽  
Christopher P. Lutz ◽  
Andreas J. Heinrich
Keyword(s):  
Metal Surfaces ◽  
Atomic Manipulation

Force Spectroscopy on Semiconductor Surfaces

2009 ◽  
pp. 31-68 ◽  
Author(s):  
Oscar Custance ◽  
Noriaki Oyabu ◽  
Yoshiaki Sugimoto
Keyword(s):  
Force Spectroscopy ◽  
Semiconductor Surfaces
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