Study of Thin Oxide Films with NC-AFM: Atomically Resolved Imaging and Beyond

Author(s):  
M. Heyde ◽  
G. H. Simon ◽  
T. König





1989 ◽  
pp. 303-310
Author(s):  
T. Paul Adl ◽  
H. F. Stehmeyer




2007 ◽  
Vol 19 (24) ◽  
pp. NA-NA
Author(s):  
M. Takahashi ◽  
T. Maeda ◽  
K. Uemura ◽  
J. Yao ◽  
Y. Tokuda ◽  
...  


1972 ◽  
Vol 12 (2) ◽  
pp. 453-456 ◽  
Author(s):  
M. Hecq ◽  
J. van Cakenberghe


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