Probing Crystal Plasticity at the Nanoscales - SpringerBriefs in Applied Sciences and Technology
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Indentation Size Effects in Single Crystal Cu as Revealed by Synchrotron X-ray Microdiffraction

Probing Crystal Plasticity at the Nanoscales - SpringerBriefs in Applied Sciences and Technology ◽

10.1007/978-981-287-335-4_6 ◽

2014 ◽

pp. 87-101

Author(s):

Arief Suriadi Budiman

Keyword(s):

Single Crystal ◽

Size Effects ◽

Indentation Size ◽

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Conclusions

Probing Crystal Plasticity at the Nanoscales - SpringerBriefs in Applied Sciences and Technology ◽

10.1007/978-981-287-335-4_8 ◽

2014 ◽

pp. 117-118

Author(s):

Arief Suriadi Budiman

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Electromigration-Induced Plasticity in Cu Interconnects: The Length Scale Dependence

Probing Crystal Plasticity at the Nanoscales - SpringerBriefs in Applied Sciences and Technology ◽

10.1007/978-981-287-335-4_3 ◽

2014 ◽

pp. 37-52

Author(s):

Arief Suriadi Budiman

Keyword(s):

Scale Dependence ◽

Length Scale ◽

Cu Interconnects

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Smaller is Stronger: Size Effects in Uniaxially Compressed Au Submicron Single Crystal Pillars

Probing Crystal Plasticity at the Nanoscales - SpringerBriefs in Applied Sciences and Technology ◽

10.1007/978-981-287-335-4_7 ◽

2014 ◽

pp. 103-115

Author(s):

Arief Suriadi Budiman

Keyword(s):

Single Crystal ◽

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Electromigration-Induced Plasticity in Cu Interconnects: The Texture Dependence

Probing Crystal Plasticity at the Nanoscales - SpringerBriefs in Applied Sciences and Technology ◽

10.1007/978-981-287-335-4_4 ◽

2014 ◽

pp. 53-67

Author(s):

Arief Suriadi Budiman

Keyword(s):

Cu Interconnects

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Synchrotron White-Beam X-ray Microdiffraction at the Advanced Light Source, Berkeley Lab

Probing Crystal Plasticity at the Nanoscales - SpringerBriefs in Applied Sciences and Technology ◽

10.1007/978-981-287-335-4_2 ◽

2014 ◽

pp. 15-35 ◽

Author(s):

Arief Suriadi Budiman

Keyword(s):

Light Source ◽

X Ray ◽

Advanced Light Source

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Introduction

Probing Crystal Plasticity at the Nanoscales - SpringerBriefs in Applied Sciences and Technology ◽

10.1007/978-981-287-335-4_1 ◽

2014 ◽

pp. 1-13

Author(s):

Arief Suriadi Budiman

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Industrial Implications of Electromigration-Induced Plasticity in Cu Interconnects: Plasticity-Amplified Diffusivity

Probing Crystal Plasticity at the Nanoscales - SpringerBriefs in Applied Sciences and Technology ◽

10.1007/978-981-287-335-4_5 ◽

2014 ◽

pp. 69-86

Author(s):

Arief Suriadi Budiman

Keyword(s):

Cu Interconnects

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