[Reliability of Compound Semiconductors] ROCS Workshop, 2005.
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Determining factors affecting ESD failure voltage using DOE

2005 ◽  
Author(s):  
C.S. Whitman ◽  
T.M. Gilbert ◽  
A.M. Rahn ◽  
J.A. Antonell
Keyword(s):  
Factors Affecting ◽  
Determining Factors

Reliability investigation of metal-semiconductor diodes in an E/D pHEMT process

2005 ◽  
Author(s):  
S. Somisetty ◽  
P. Ersland ◽  
Xinxing Yang

Reliability testing of an lna with 0.18 /spl mu/m gate process

2005 ◽  
Author(s):  
H.-R.H. Jen ◽  
P. Ersland ◽  
C. Gil ◽  
Shiou Lung ◽  
G. Chu
Keyword(s):  
Reliability Testing

Physical evidence of electromigration in GaAs PHEMT Schottky diodes operating at high forward current density

2005 ◽  
Author(s):  
Y.C. Chou ◽  
D. Leung ◽  
M. Biedenbender ◽  
D. Eng ◽  
Q. Kan ◽  
...  
Keyword(s):  
Current Density ◽  
Schottky Diodes ◽  
Physical Evidence ◽  
Forward Current
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