[Reliability of Compound Semiconductors] ROCS Workshop, 2005.
Latest Publications

TOTAL DOCUMENTS

25

(FIVE YEARS 0)

H-INDEX

2

(FIVE YEARS 0)

Published By IEEE

079080106x

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

[Breaker page]

[Reliability of Compound Semiconductors] ROCS Workshop, 2005. ◽

10.1109/rocs.2005.201550 ◽

2005 ◽

Download Full-text

Thermal acceleration of compound semiconductors in humidity

[Reliability of Compound Semiconductors] ROCS Workshop, 2005. ◽

10.1109/rocs.2005.201557 ◽

2005 ◽

Cited By ~ 2

Author(s):

W.J. Roesch

Keyword(s):

Compound Semiconductors

Download Full-text

[Breaker page]

[Reliability of Compound Semiconductors] ROCS Workshop, 2005. ◽

10.1109/rocs.2005.201562 ◽

2005 ◽

Download Full-text

[Breaker page]

[Reliability of Compound Semiconductors] ROCS Workshop, 2005. ◽

10.1109/rocs.2005.201558 ◽

2005 ◽

Download Full-text

Reliability of compound semiconductor workshop historical review

[Reliability of Compound Semiconductors] ROCS Workshop, 2005. ◽

10.1109/rocs.2005.201549 ◽

2005 ◽

Cited By ~ 5

Author(s):

W.J. Roesch

Keyword(s):

Historical Review ◽

Compound Semiconductor

Download Full-text

Determining factors affecting ESD failure voltage using DOE

[Reliability of Compound Semiconductors] ROCS Workshop, 2005. ◽

10.1109/rocs.2005.201553 ◽

2005 ◽

Cited By ~ 2

Author(s):

C.S. Whitman ◽

T.M. Gilbert ◽

A.M. Rahn ◽

J.A. Antonell

Keyword(s):

Factors Affecting ◽

Determining Factors

Download Full-text

Committee

[Reliability of Compound Semiconductors] ROCS Workshop, 2005. ◽

10.1109/rocs.2005.201546 ◽

2005 ◽

Download Full-text

Reliability investigation of metal-semiconductor diodes in an E/D pHEMT process

[Reliability of Compound Semiconductors] ROCS Workshop, 2005. ◽

10.1109/rocs.2005.201564 ◽

2005 ◽

Author(s):

S. Somisetty ◽

P. Ersland ◽

Xinxing Yang

Download Full-text

Reliability testing of an lna with 0.18 /spl mu/m gate process

[Reliability of Compound Semiconductors] ROCS Workshop, 2005. ◽

10.1109/rocs.2005.201563 ◽

2005 ◽

Author(s):

H.-R.H. Jen ◽

P. Ersland ◽

C. Gil ◽

Shiou Lung ◽

G. Chu

Keyword(s):

Reliability Testing

Download Full-text

Physical evidence of electromigration in GaAs PHEMT Schottky diodes operating at high forward current density

[Reliability of Compound Semiconductors] ROCS Workshop, 2005. ◽

10.1109/rocs.2005.201565 ◽

2005 ◽

Author(s):

Y.C. Chou ◽

D. Leung ◽

M. Biedenbender ◽

D. Eng ◽

Q. Kan ◽

...

Keyword(s):

Current Density ◽

Schottky Diodes ◽

Physical Evidence ◽

Forward Current

Download Full-text