Microscopy of Semiconducting Materials 2001
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Published By CRC Press

9781351074629
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SEM doping contrast at a Si pn junction

2018 ◽  
pp. 431-434
Author(s):  
S L Elliott ◽  
R F Broom ◽  
C J Humphreys
Keyword(s):  
Pn Junction

Substrate and annealing dependent crystallization of Si/Si02 superlattice structures

2018 ◽  
pp. 419-422
Author(s):  
S Karirinne ◽  
J Keränen ◽  
T Lepistö ◽  
J Sinkkonen
Keyword(s):  
Superlattice Structures

EFTEM study of plasma etched low-k Si-O-C dielectrics

2018 ◽  
pp. 415-418 ◽  
Author(s):  
S Hens ◽  
H Bender ◽  
R A Donaton ◽  
K Maex ◽  
S Vanhaelemeersch ◽  
...  
Keyword(s):  
Low K

Characterisation of ALCVD ZrO2 thin films by TEM

2018 ◽  
pp. 407-410
Author(s):  
O Richard ◽  
H Bender ◽  
M Houssa ◽  
C Zhao
Keyword(s):  
Thin Films

Evaluation and quantification by electron back-scattering diffraction of the microstructure of laser-crystallized silicon thin films

2018 ◽  
pp. 387-390
Author(s):  
S Christiansen ◽  
M Nerding ◽  
G Esser ◽  
U Urmoneit ◽  
A Otto ◽  
...  
Keyword(s):  
Thin Films ◽  
Silicon Thin Films ◽  
Back Scattering

Variations in the degree of order of GaN epilayer mosaic structure after Si doping

2018 ◽  
pp. 341-344
Author(s):  
N M Shmidt ◽  
A G Kolmakov ◽  
M S Dunaevsky ◽  
V V Emtsev ◽  
A S Kryzhanovsky ◽  
...  
Keyword(s):  
Mosaic Structure ◽  
Si Doping ◽  
Degree Of Order

Core structure of dislocations in GaN revealed by transmission electron microscopy

2018 ◽  
pp. 323-326
Author(s):  
T Remmele ◽  
M Albrecht ◽  
H P Strunk ◽  
A T Blumenau ◽  
M I Heggie ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Core Structure ◽  
Transmission Electron

Composition of InGaN: In distribution and influence of lattice strain

2018 ◽  
pp. 273-276 ◽  
Author(s):  
M Schowalter ◽  
P Pfundstein ◽  
E Hahn ◽  
B Neubauer ◽  
A Rosenauer ◽  
...  
Keyword(s):  
Lattice Strain
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