2004 International Conferce on Test
Latest Publications

TOTAL DOCUMENTS

214

(FIVE YEARS 0)

H-INDEX

25

(FIVE YEARS 0)

Published By IEEE

0780385802

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Test in the era of "What you see is not what you get" - Keynote address

2004 International Conferce on Test ◽

10.1109/test.2004.1386929 ◽

2005 ◽

Author(s):

B. Koenemann

Keyword(s):

Keynote Address

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New test paradigms for yield and manufacturability - Invited address

2004 International Conferce on Test ◽

10.1109/test.2004.1386930 ◽

2005 ◽

Author(s):

R. Madge

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Global failure localization: we have to, but on what and how?

2004 International Conferce on Test ◽

10.1109/test.2004.1387448 ◽

2005 ◽

Author(s):

E.I. Cole

Keyword(s):

Failure Localization

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The critical need for open ATE architecture

2004 International Conferce on Test ◽

10.1109/test.2004.1387417 ◽

2005 ◽

Author(s):

S.M. Perez

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Data compression for multiple scan chains using dictionaries with corrections

2004 International Conferce on Test ◽

10.1109/test.2004.1387357 ◽

2005 ◽

Author(s):

A. Wurtenberger ◽

C.S. Tautermann ◽

S. Hellebrand

Keyword(s):

Data Compression ◽

Multiple Scan ◽

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CMOS IC diagnostics using the luminescence of off-state leakage currents

2004 International Conferce on Test ◽

10.1109/test.2004.1386945 ◽

2005 ◽

Author(s):

S. Polonsky ◽

K.A. Jenkins ◽

A. Weger ◽

Shinho Cho

Keyword(s):

Leakage Currents ◽

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Test scheduling for network-on-chip with BIST and precedence constraints

2004 International Conferce on Test ◽

10.1109/test.2004.1387412 ◽

2005 ◽

Author(s):

Chunsheng Liu ◽

E. Cota ◽

H. Sharif ◽

D.K. Pradhan

Keyword(s):

Network On Chip ◽

Precedence Constraints ◽

Test Scheduling ◽

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Minimizing power consumption in scan testing: pattern generation and DFT techniques

2004 International Conferce on Test ◽

10.1109/test.2004.1386971 ◽

2005 ◽

Author(s):

K.M. Butler ◽

J. Saxena ◽

A. Jain ◽

T. Fryars ◽

J. Lewis ◽

...

Keyword(s):

Power Consumption ◽

Pattern Generation ◽

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Divide and conquer based Fast Shmoo algorithms

2004 International Conferce on Test ◽

10.1109/test.2004.1386953 ◽

2005 ◽

Author(s):

P. Patten

Keyword(s):

Divide And Conquer

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Testing the configurable analog blocks of field programmable analog arrays

2004 International Conferce on Test ◽

10.1109/test.2004.1387353 ◽

2005 ◽

Author(s):

T. Balen ◽

A. Andrade ◽

F. Azais ◽

M. Lubaszewski ◽

M. Renovell

Keyword(s):

Programmable Analog ◽

Field Programmable ◽

Field Programmable Analog Arrays ◽

Analog Blocks ◽

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