Test Resource Partitioning for System-on-a-Chip - Frontiers in Electronic Testing
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Published By Springer US

9781461354000, 9781461511137

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Improved Test Bus Partitioning

Test Resource Partitioning for System-on-a-Chip - Frontiers in Electronic Testing ◽

10.1007/978-1-4615-1113-7_3 ◽

2002 ◽

pp. 45-64

Author(s):

Krishnendu Chakrabarty ◽

Vikram Iyengar ◽

Anshuman Chandra

Test Access Mechanism Optimization

Test Resource Partitioning for System-on-a-Chip - Frontiers in Electronic Testing ◽

10.1007/978-1-4615-1113-7_2 ◽

2002 ◽

pp. 19-43

Author(s):

Krishnendu Chakrabarty ◽

Vikram Iyengar ◽

Anshuman Chandra

Keyword(s):

Mechanism Optimization ◽

Test Access Mechanism

TRP for Low-Power Scan Testing

Test Resource Partitioning for System-on-a-Chip - Frontiers in Electronic Testing ◽

10.1007/978-1-4615-1113-7_9 ◽

2002 ◽

pp. 203-216

Author(s):

Krishnendu Chakrabarty ◽

Vikram Iyengar ◽

Anshuman Chandra

Keyword(s):

Low Power ◽

Scan Testing

Conclusion

Test Resource Partitioning for System-on-a-Chip - Frontiers in Electronic Testing ◽

10.1007/978-1-4615-1113-7_10 ◽

2002 ◽

pp. 217-221

Author(s):

Krishnendu Chakrabarty ◽

Vikram Iyengar ◽

Anshuman Chandra

Frequency-Directed Run-Length (FDR) Codes

Test Resource Partitioning for System-on-a-Chip - Frontiers in Electronic Testing ◽

10.1007/978-1-4615-1113-7_8 ◽

2002 ◽

pp. 179-201

Author(s):

Krishnendu Chakrabarty ◽

Vikram Iyengar ◽

Anshuman Chandra

Keyword(s):

Run Length

Precedence-Based, Preemptive, and Power-Constrained Test Scheduling

Test Resource Partitioning for System-on-a-Chip - Frontiers in Electronic Testing ◽

10.1007/978-1-4615-1113-7_6 ◽

2002 ◽

pp. 119-134

Author(s):

Krishnendu Chakrabarty ◽

Vikram Iyengar ◽

Anshuman Chandra

Keyword(s):

Test Scheduling

Test Wrapper and TAM Co-Optimization

Test Resource Partitioning for System-on-a-Chip - Frontiers in Electronic Testing ◽

10.1007/978-1-4615-1113-7_4 ◽

2002 ◽

pp. 65-93

Author(s):

Krishnendu Chakrabarty ◽

Vikram Iyengar ◽

Anshuman Chandra

Keyword(s):

Test Wrapper

Test Data Compression Using Golomb Codes

Test Resource Partitioning for System-on-a-Chip - Frontiers in Electronic Testing ◽

10.1007/978-1-4615-1113-7_7 ◽

2002 ◽

pp. 137-178

Author(s):

Krishnendu Chakrabarty ◽

Vikram Iyengar ◽

Anshuman Chandra

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Golomb Codes

Test Scheduling Using Mixed-Integer Linear Programming

Test Resource Partitioning for System-on-a-Chip - Frontiers in Electronic Testing ◽

10.1007/978-1-4615-1113-7_5 ◽

2002 ◽

pp. 97-118

Author(s):

Krishnendu Chakrabarty ◽

Vikram Iyengar ◽

Anshuman Chandra

Keyword(s):

Linear Programming ◽

Integer Linear Programming ◽

Mixed Integer Linear Programming ◽

Mixed Integer ◽

Test Scheduling