2010 IEEE International Conference on Semiconductor Electronics (ICSE2010)
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9781424466085
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Electrical properties of sputtered deposited tungsten silicide films

2010 ◽  
Author(s):  
Jian-Wei Hoon ◽  
Kah-Yoong Chan ◽  
Jegenathan Krishnasamy ◽  
Sharul Ashikin Binti Kamaruddin ◽  
Hin-Yong Wong ◽  
...  
Keyword(s):  
Electrical Properties ◽  
Tungsten Silicide

Thermal stress test for PLED

2010 ◽  
Author(s):  
B. K. Yap ◽  
S. P. Koh ◽  
S. K. Tiong ◽  
C. N. Ong
Keyword(s):  
Thermal Stress ◽  
Stress Test

GaAs based diffusion welded high voltage diode stacks

2010 ◽  
Author(s):  
Jana Toompuu ◽  
Oleg Korolkov ◽  
Natalja Sleptsuk ◽  
Viktor Vojtovich ◽  
Toomas Rang
Keyword(s):  
High Voltage
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