2019 IEEE International Test Conference in Asia (ITC-Asia)
Latest Publications

TOTAL DOCUMENTS

43
(FIVE YEARS 0)

H-INDEX

2
(FIVE YEARS 0)

Published By IEEE

9781728147185
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Crest Factor Controlled Multi-Tone Signals for Analog/Mixed-Signal IC Testing

2019 ◽  
Author(s):  
Yukiko Shibasaki ◽  
Koji Asami ◽  
Anna Kuwana ◽  
Kosuke Machida ◽  
Yuanyang Du ◽  
...  
Keyword(s):  
Crest Factor ◽  
Mixed Signal ◽  
Ic Testing ◽  
Mixed Signal Ic

An FPGA-Based Data Receiver for Digital IC Testing

2019 ◽  
Author(s):  
Wei-Chen Huang ◽  
Guan-Hao Hou ◽  
Jiun-Lang Huang ◽  
Terry Kuo
Keyword(s):  
Ic Testing

Test-Plan Optimization for Flying-Probes In-Circuit Testers

2019 ◽  
Author(s):  
Luciano Bonaria ◽  
Maurizio Raganato ◽  
Giovanni Squillero ◽  
Matteo Sonza Reorda
Keyword(s):  
Test Plan ◽  
Plan Optimization

A Framework for TSV Based 3D-IC to Analyze Aging and TSV Thermo-Mechanical Stress on Soft Errors

2019 ◽  
Author(s):  
Raviteja P Reddy ◽  
Amit Acharyya ◽  
Saqib Khursheed
Keyword(s):  
Mechanical Stress ◽  
Soft Errors ◽  
3D Ic

Optimization of Cell-Aware ATPG Results by Manipulating Library Cells' Defect Detection Matrices

2019 ◽  
Author(s):  
Zhan Gao ◽  
Min-Chun Hu ◽  
Joe Swenton ◽  
Santosh Malagi ◽  
Jos Huisken ◽  
...  
Keyword(s):  
Defect Detection

Accurate and Fast Testing Technique of Operational Amplifier DC Offset Voltage in µV-Order by DC-AC Conversion

2019 ◽  
Author(s):  
Yuto Sasaki ◽  
Tamotsu Ichikawa ◽  
Anna Kuwana ◽  
Kazumi Hatayama ◽  
Haruo Kobayashi ◽  
...  
Keyword(s):  
Operational Amplifier ◽  
Testing Technique ◽  
Dc Offset ◽  
Offset Voltage
Load More ...
Sign in / Sign up

Export Citation Format

Share Document