2019 IEEE International Test Conference in Asia (ITC-Asia)
Latest Publications

TOTAL DOCUMENTS

43

(FIVE YEARS 43)

H-INDEX

2

(FIVE YEARS 2)

Published By IEEE

9781728147185

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

[Title page iii]

2019 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia.2019.00002 ◽

2019 ◽

Keyword(s):

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Crest Factor Controlled Multi-Tone Signals for Analog/Mixed-Signal IC Testing

2019 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia.2019.00015 ◽

2019 ◽

Author(s):

Yukiko Shibasaki ◽

Koji Asami ◽

Anna Kuwana ◽

Kosuke Machida ◽

Yuanyang Du ◽

...

Keyword(s):

Crest Factor ◽

Mixed Signal ◽

Mixed Signal Ic

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An FPGA-Based Data Receiver for Digital IC Testing

2019 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia.2019.00018 ◽

2019 ◽

Author(s):

Wei-Chen Huang ◽

Guan-Hao Hou ◽

Jiun-Lang Huang ◽

Terry Kuo

Keyword(s):

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A Selection Method of Ring Oscillators for An On-Chip Digital Temperature And Voltage Sensor

2019 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia.2019.00016 ◽

2019 ◽

Author(s):

Yousuke Miyake ◽

Yasuo Sato ◽

Seiji Kajihara

Keyword(s):

Selection Method ◽

Voltage Sensor ◽

Ring Oscillators ◽

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Test-Plan Optimization for Flying-Probes In-Circuit Testers

2019 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia.2019.00017 ◽

2019 ◽

Author(s):

Luciano Bonaria ◽

Maurizio Raganato ◽

Giovanni Squillero ◽

Matteo Sonza Reorda

Keyword(s):

Test Plan ◽

Plan Optimization

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A Framework for TSV Based 3D-IC to Analyze Aging and TSV Thermo-Mechanical Stress on Soft Errors

2019 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia.2019.00034 ◽

2019 ◽

Author(s):

Raviteja P Reddy ◽

Amit Acharyya ◽

Saqib Khursheed

Keyword(s):

Mechanical Stress ◽

Soft Errors ◽

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Optimization of Cell-Aware ATPG Results by Manipulating Library Cells' Defect Detection Matrices

2019 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia.2019.00029 ◽

2019 ◽

Author(s):

Zhan Gao ◽

Min-Chun Hu ◽

Joe Swenton ◽

Santosh Malagi ◽

Jos Huisken ◽

...

Keyword(s):

Defect Detection

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A Hybrid Embedded Multichannel Test Compression Architecture for Low-Pin Count Test Environments in Safety-Critical Systems

2019 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia.2019.00033 ◽

2019 ◽

Author(s):

Sebastian Huhn ◽

Daniel Tille ◽

Rolf Drechsler

Keyword(s):

Critical Systems ◽

Safety Critical ◽

Test Compression ◽

Safety Critical Systems

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Author Index

2019 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia.2019.00043 ◽

2019 ◽

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Program Committee

2019 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia.2019.00008 ◽

2019 ◽

Keyword(s):

Program Committee

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