AUTOTESTCON 93
Latest Publications

TOTAL DOCUMENTS

95

(FIVE YEARS 0)

H-INDEX

4

(FIVE YEARS 0)

Published By IEEE

0780306465

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Test design compilers complement top down ASIC design

AUTOTESTCON 93 ◽

10.1109/autest.1993.396313 ◽

2002 ◽

Author(s):

A. Halliday ◽

G. Young

Keyword(s):

Test Design ◽

Top Down ◽

Download Full-text

CASPER An expert system approach to TPS cost management

AUTOTESTCON 93 ◽

10.1109/autest.1993.396341 ◽

2002 ◽

Author(s):

M.T. Ellis

Keyword(s):

Expert System ◽

System Approach ◽

Cost Management

Download Full-text

Enhancing mission effectiveness through electro-optical systems readiness: IFTE CTS-EOA system requirements

AUTOTESTCON 93 ◽

10.1109/autest.1993.396364 ◽

2002 ◽

Author(s):

D.L. Fraley ◽

J.A. Cameron

Keyword(s):

Optical Systems ◽

System Requirements ◽

Mission Effectiveness

Download Full-text

Integration of neural network technology in automated fault diagnosis equipment

AUTOTESTCON 93 ◽

10.1109/autest.1993.396328 ◽

2002 ◽

Author(s):

K.L. Priddy ◽

M.D. Lothers ◽

R.E. Saeks

Keyword(s):

Neural Network ◽

Fault Diagnosis ◽

Network Technology ◽

Neural Network Technology

Download Full-text

Automatic test program generation using graphical tools for producing factory and CASS ATLAS test code

AUTOTESTCON 93 ◽

10.1109/autest.1993.396372 ◽

2002 ◽

Author(s):

M.C. Scallan

Keyword(s):

Automatic Test ◽

Test Program ◽

Program Generation

Download Full-text

Diagnostic performance: The need for a new metric

AUTOTESTCON 93 ◽

10.1109/autest.1993.396283 ◽

2002 ◽

Author(s):

S.H. Hutchings ◽

C.F. Willis

Keyword(s):

Diagnostic Performance

Download Full-text

A generalized algorithm for bounding fault detection probabilities in combinational circuits

AUTOTESTCON 93 ◽

10.1109/autest.1993.396288 ◽

2002 ◽

Author(s):

R. Pathak

Keyword(s):

Fault Detection ◽

Combinational Circuits ◽

Detection Probabilities

Download Full-text

Virtual instruments: The future of ATE is here today

AUTOTESTCON 93 ◽

10.1109/autest.1993.396348 ◽

2002 ◽

Author(s):

L. Moskowitz

Keyword(s):

Virtual Instruments ◽

Download Full-text

Object oriented CASE: The TPS life cycle evolution

AUTOTESTCON 93 ◽

10.1109/autest.1993.396369 ◽

2002 ◽

Author(s):

M. Ellis

Keyword(s):

Object Oriented ◽

Life Cycle Evolution

Download Full-text

Mission relevant testing

AUTOTESTCON 93 ◽

10.1109/autest.1993.396363 ◽

2002 ◽

Author(s):

M. Lopez ◽

M. Horman ◽

T. Luu ◽

H. Orlando

Download Full-text