Advanced Metrology
Latest Publications

TOTAL DOCUMENTS

17
(FIVE YEARS 17)

H-INDEX

0
(FIVE YEARS 0)

Published By Elsevier

9780128218150
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Free-form surface reconstruction

2020 ◽  
pp. 93-127
Author(s):  
X. Jane Jiang ◽  
Paul J. Scott
Keyword(s):  
Surface Reconstruction ◽  
Free Form ◽  
Free Form Surface

Characterization of free-form surfaces

2020 ◽  
pp. 247-280
Author(s):  
X. Jane Jiang ◽  
Paul J. Scott
Keyword(s):  
Free Form ◽  
Free Form Surfaces

Characterization of free-form structured surfaces

2020 ◽  
pp. 281-317
Author(s):  
X. Jane Jiang ◽  
Paul J. Scott
Keyword(s):  
Free Form ◽  
Structured Surfaces

Smart surface design and metrology platform

2020 ◽  
pp. 319-353
Author(s):  
X. Jane Jiang ◽  
Paul J. Scott
Keyword(s):  
Surface Design ◽  
Smart Surface

Free-form surface sampling

2020 ◽  
pp. 35-63
Author(s):  
X. Jane Jiang ◽  
Paul J. Scott
Keyword(s):  
Free Form ◽  
Surface Sampling ◽  
Free Form Surface
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