Advances in X-Ray Analysis
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47
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6
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Published By Springer US

9781468476354, 9781468476330
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

The Application of Cylindrical Geometry for the Determination of Crystal Orientation

1966 ◽  
pp. 51-58
Author(s):  
Robert D. Forest ◽  
Richard J. Barton ◽  
N. C. Schieltz
Keyword(s):  
Crystal Orientation ◽  
Cylindrical Geometry

X-Ray Techniques in the 1 to 400 Å Range

1966 ◽  
pp. 410-419 ◽  
Author(s):  
Andrew A. Sterk
Keyword(s):  
X Ray

The Effect of Chemical Combination on X-Ray Spectra: Open Discussion

1966 ◽  
pp. 393-397
Author(s):  
Gavin R. Mallett ◽  
Marie J. Fay ◽  
William M. Mueller
Keyword(s):  
X Ray ◽  
Chemical Combination ◽  
Open Discussion

Lattice Defect Research by Kossel Technique and Deformation Analysis

1966 ◽  
pp. 23-34 ◽  
Author(s):  
Masataka Umeno ◽  
Hideaki Kawabe ◽  
Gunji Shinoda
Keyword(s):  
Lattice Defect ◽  
Deformation Analysis ◽  
Kossel Technique

The Effect of Chemical Combination on the K X-ray Spectra of Silicon

1966 ◽  
pp. 323-328 ◽  
Author(s):  
Donald M. Koffman ◽  
Sheldon H. Moll
Keyword(s):  
X Ray ◽  
Chemical Combination
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