2020 IEEE International Conference on Design & Test of Integrated Micro & Nano-Systems (DTS)
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9781728154299

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2020 IEEE International Conference on Design & Test of Integrated Micro & Nano-Systems (DTS) ◽

10.1109/dts48731.2020.9196084 ◽

2020 ◽

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2020 IEEE International Conference on Design & Test of Integrated Micro & Nano-Systems (DTS) ◽

10.1109/dts48731.2020.9196060 ◽

2020 ◽

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Low-complexity passive mixer-based UWB pulse generator with leakage compensation and spectrum Tunability

2020 IEEE International Conference on Design & Test of Integrated Micro & Nano-Systems (DTS) ◽

10.1109/dts48731.2020.9196120 ◽

2020 ◽

Author(s):

Benali Saif ◽

Trabelsi Hatem

Keyword(s):

Pulse Generator ◽

Low Complexity ◽

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Instruction-level Reliability Improvement for Embedded Systems

2020 IEEE International Conference on Design & Test of Integrated Micro & Nano-Systems (DTS) ◽

10.1109/dts48731.2020.9196195 ◽

2020 ◽

Author(s):

Hakan Tekgul ◽

Ozcan Ozturk

Keyword(s):

Embedded Systems ◽

Reliability Improvement

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Study of a Single-Photon Avalanche Diode Models

2020 IEEE International Conference on Design & Test of Integrated Micro & Nano-Systems (DTS) ◽

10.1109/dts48731.2020.9196074 ◽

2020 ◽

Author(s):

Hatem Dhouib ◽

Amel Neifar ◽

Abdessattar Bouzid ◽

Mohamed Masmoudi

Keyword(s):

Single Photon ◽

Avalanche Diode

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Investigation on Structural and Electronic Properties of Zn1- xMgxO in Wurtzite Phase Using First Principal calculations

2020 IEEE International Conference on Design & Test of Integrated Micro & Nano-Systems (DTS) ◽

10.1109/dts48731.2020.9196142 ◽

2020 ◽

Author(s):

F.Z. Aouacheria ◽

A. Telia ◽

A. Meziani

Keyword(s):

Electronic Properties ◽

Wurtzite Phase ◽

Structural And Electronic Properties

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Synapse design based on memristor

2020 IEEE International Conference on Design & Test of Integrated Micro & Nano-Systems (DTS) ◽

10.1109/dts48731.2020.9196061 ◽

2020 ◽

Author(s):

Mouna Elhamdaoui ◽

Khaoula Mbarek ◽

Sami Ghedira ◽

Faten Ouaja Rziga ◽

Kamel Besbes

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Reliable 3D 1D1R-1R1D Solution for Victim Layers in Monolithic RRAM Integration

2020 IEEE International Conference on Design & Test of Integrated Micro & Nano-Systems (DTS) ◽

10.1109/dts48731.2020.9196043 ◽

2020 ◽

Author(s):

K. Lahbacha ◽

F. Zayer ◽

W. Dghais ◽

A. Maffucci ◽

H. Belgacem

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NB-PLC and RF Characterization for AMI Smart Grid Application In Urban Environment

2020 IEEE International Conference on Design & Test of Integrated Micro & Nano-Systems (DTS) ◽

10.1109/dts48731.2020.9196108 ◽

2020 ◽

Author(s):

Amani Aloui ◽

Ons Ben Rhouma ◽

Chiheb Rebai

Keyword(s):

Urban Environment ◽

Grid Application

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Spin Connection Topology and Multi-Bit Spin Interaction Coefficients of Ising Spin Model with Digital Logic Gates

2020 IEEE International Conference on Design & Test of Integrated Micro & Nano-Systems (DTS) ◽

10.1109/dts48731.2020.9196051 ◽

2020 ◽

Author(s):

T. Miki ◽

M. Shimada ◽

J. Shirakashi

Keyword(s):

Logic Gates ◽

Digital Logic ◽

Spin Interaction ◽

Spin Connection ◽

Interaction Coefficients ◽

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