Proceedings AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference.
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Super scalar architecture for billion device combinational and sequential circuit test design

Proceedings AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. ◽

10.1109/autest.2003.1243647 ◽

2004 ◽

Author(s):

N. Venkateswaran ◽

V. Balaji ◽

V. Mahalingam ◽

T.L. Rajaprabhu

Keyword(s):

Test Design ◽

Sequential Circuit

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On multi-mode test sequencing problem

Proceedings AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. ◽

10.1109/autest.2003.1243577 ◽

2004 ◽

Author(s):

Sui Ruan ◽

Fang Tu ◽

K.R. Pattipati

Keyword(s):

Sequencing Problem ◽

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Achieving instrument interchangeability with IVI instrument drivers

Proceedings AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. ◽

10.1109/autest.2003.1243611 ◽

2004 ◽

Author(s):

J.E. Mueller

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Testing commercial & military RF systems with PXI instrumentation modules

Proceedings AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. ◽

10.1109/autest.2003.1243568 ◽

2004 ◽

Author(s):

C.D. Ziomek ◽

D.C. Robinson

Keyword(s):

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Next generation COTS test systems

Proceedings AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. ◽

10.1109/autest.2003.1243567 ◽

2004 ◽

Author(s):

T.M. Neal

Keyword(s):

Next Generation ◽

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A new direction for test software [RF/microwave test equipment]

Proceedings AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. ◽

10.1109/autest.2003.1243600 ◽

2004 ◽

Author(s):

J.R. Sigler

Keyword(s):

Test Equipment ◽

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Probabilities associated with a built-in-test system, focus on false alarms

Proceedings AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. ◽

10.1109/autest.2003.1243644 ◽

2004 ◽

Author(s):

D. Allen

Keyword(s):

Test System ◽

False Alarms ◽

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Keeping pace with technological advances when funding resources are diminished [military systems]

Proceedings AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. ◽

10.1109/autest.2003.1243635 ◽

2004 ◽

Author(s):

D.L. Schafer

Keyword(s):

Technological Advances ◽

Military Systems

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The BRIC - a new generation of PXI switch products [ATE system applications]

Proceedings AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. ◽

10.1109/autest.2003.1243616 ◽

2004 ◽

Author(s):

K. Moore ◽

D. Owen

Keyword(s):

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Enhanced integrated satellite factory test environment

Proceedings AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. ◽

10.1109/autest.2003.1243637 ◽

2004 ◽

Author(s):

J.L. Amsell

Keyword(s):

Test Environment ◽

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