Proceedings 10th Asian Test Symposium
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81
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13
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0769513786
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Faulty resistance sectioning technique for resistive bridging fault ATPG systems

2002 ◽  
Author(s):  
T. Shinogi ◽  
T. Kanbayashi ◽  
T. Yoshikawa ◽  
S. Tsuruoka ◽  
T. Hayashi
Keyword(s):  
Bridging Fault

An RT-level ATPG based on clustering of circuit states

2002 ◽  
Author(s):  
Huawei Li ◽  
Yinghua Min ◽  
Zhongcheng Li

TX7901 DFT

2002 ◽  
Author(s):  
T. Kamada

An approach to RTL fault extraction and test generation

2002 ◽  
Author(s):  
Zhigang Yin ◽  
Yinghua Min ◽  
Xiaowei Li
Keyword(s):  
Test Generation

Short circuit faults in state-of-the-art ADCs - are they hard or soft?

2002 ◽  
Author(s):  
A. Lechner ◽  
A. Richardson ◽  
B. Hermes
Keyword(s):  
State Of The Art ◽  
Short Circuit

A new code-disjoint sum-bit duplicated carry look-ahead adder for parity codes

2002 ◽  
Author(s):  
E.S. Sogomonyan ◽  
V. Ocheretnij ◽  
M. Gossel
Keyword(s):  
Look Ahead

A DFT method for core-based systems-on-a-chip based on consecutive testability

2002 ◽  
Author(s):  
T. Yoneda ◽  
H. Fujiwara
Keyword(s):  
Dft Method

Selecting a PRPG: randomness, primitiveness, or sheer luck?

2002 ◽  
Author(s):  
I. Bayraktaroglu ◽  
A. Orailoglu

I/sub DDQ/ sensing technique for high speed IDDQ testing

2002 ◽  
Author(s):  
T. Takeda ◽  
M. Hashizume ◽  
M. Ichimiya ◽  
H. Yotsuyanagi ◽  
Y. Miura ◽  
...  
Keyword(s):  
High Speed ◽  
Iddq Testing
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