2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400)
Latest Publications

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157

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Post-irradiation behavior of commercial power VDMOSFETs

2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400) ◽

10.1109/icmel.2000.840585 ◽

2002 ◽

Author(s):

A.B. Jaksic ◽

M.M. Pejovic ◽

G.S. Ristic

Keyword(s):

Post Irradiation ◽

Irradiation Behavior

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RESCUER-the revolution in multidomain simulations. I

2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400) ◽

10.1109/icmel.2000.838751 ◽

2002 ◽

Cited By ~ 1

Author(s):

M. Zubert ◽

A. Napieralski

Keyword(s):

The Revolution

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Electron spectra in simple superlattices

2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400) ◽

10.1109/icmel.2000.840549 ◽

2002 ◽

Author(s):

S.M. Stojkovic ◽

J.P. Setrajcic ◽

I. Junger ◽

I.D. Vragovic ◽

S.B. Lazarev

Keyword(s):

Electron Spectra

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Reliability of surface micromachined MicroElectroMechanical actuators

2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400) ◽

10.1109/icmel.2000.840535 ◽

2002 ◽

Cited By ~ 8

Author(s):

D.M. Tanner

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SiGe technologies for wireless microwave and millimeter-wave applications

2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400) ◽

10.1109/icmel.2000.838723 ◽

2002 ◽

Cited By ~ 1

Author(s):

R. Plana

Keyword(s):

Millimeter Wave

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Ordinary and polaritonic photodetectors and chemical sensors on the basis of Schottky barrier with corrugated interface

2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400) ◽

10.1109/icmel.2000.838760 ◽

2002 ◽

Author(s):

N.L. Dmitruk ◽

O.Yu. Borkovskaya ◽

I.B. Mamontova ◽

S.V. Mamykin ◽

O.I. Mayeva ◽

...

Keyword(s):

Schottky Barrier ◽

Chemical Sensors

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Burst noise with normal distribution of characteristic times in sub-micron ultra-thin-oxide MOSFET's

2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400) ◽

10.1109/icmel.2000.840596 ◽

2002 ◽

Author(s):

P. Hruska ◽

R. Kolarova ◽

J. Sikula

Keyword(s):

Normal Distribution ◽

Burst Noise ◽

Thin Oxide

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Radiation effects in the space telecommunications environment

2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400) ◽

10.1109/icmel.2000.840529 ◽

2002 ◽

Cited By ~ 2

Author(s):

D.M. Fleetwood ◽

P.S. Winokur

Keyword(s):

Radiation Effects

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Microelectronics and photonics-the future

2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400) ◽

10.1109/icmel.2000.840525 ◽

2002 ◽

Cited By ~ 3

Author(s):

E. Suhir

Keyword(s):

The Future

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Analysis of Fowler-Nordheim injection in NO nitrided gate oxide grown on n-type 4H-SiC

2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400) ◽

10.1109/icmel.2000.840582 ◽

2002 ◽

Author(s):

Hui-Feng Li ◽

S. Dimitrijev ◽

D. Sweatman ◽

H.B. Harrison

Keyword(s):

Gate Oxide

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2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Post-irradiation behavior of commercial power VDMOSFETs

RESCUER-the revolution in multidomain simulations. I

Electron spectra in simple superlattices

Reliability of surface micromachined MicroElectroMechanical actuators

SiGe technologies for wireless microwave and millimeter-wave applications

Ordinary and polaritonic photodetectors and chemical sensors on the basis of Schottky barrier with corrugated interface

Burst noise with normal distribution of characteristic times in sub-micron ultra-thin-oxide MOSFET's

Radiation effects in the space telecommunications environment

Microelectronics and photonics-the future

Analysis of Fowler-Nordheim injection in NO nitrided gate oxide grown on n-type 4H-SiC

2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400)
Latest Publications