2009 IEEE AUTOTESTCON
Latest Publications

TOTAL DOCUMENTS

101

(FIVE YEARS 0)

H-INDEX

4

(FIVE YEARS 0)

Published By IEEE

9781424449804

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

FPGA implementation of a configurable viterbi decoder for software radio receiver

2009 IEEE AUTOTESTCON ◽

10.1109/autest.2009.5314063 ◽

2009 ◽

Cited By ~ 3

Author(s):

Sherif Welsen Shaker ◽

Salwa Hussien Elramly ◽

Khaled Ali Shehata

Keyword(s):

Software Radio ◽

Fpga Implementation ◽

Radio Receiver ◽

Viterbi Decoder

Managing the transition to IEEE 1641, via ATLAS based test systems

2009 IEEE AUTOTESTCON ◽

10.1109/autest.2009.5314015 ◽

2009 ◽

Cited By ~ 1

Author(s):

Ashley M B Hulme

Keyword(s):

Test Systems

IEEE Std 1641

2009 IEEE AUTOTESTCON ◽

10.1109/autest.2009.5314021 ◽

2009 ◽

Cited By ~ 1

Author(s):

Chris Gorringe

To upgrade my ATE or not to upgrade

2009 IEEE AUTOTESTCON ◽

10.1109/autest.2009.5314041 ◽

2009 ◽

Author(s):

Joe LaGrotta ◽

Duane Lowenstein

A hierarchical framework for fault propagation analysis in complex systems

2009 IEEE AUTOTESTCON ◽

10.1109/autest.2009.5314003 ◽

2009 ◽

Cited By ~ 1

Author(s):

Manzar Abbas ◽

George J. Vachtsevanos

Keyword(s):

Complex Systems ◽

Fault Propagation ◽

Hierarchical Framework ◽

Propagation Analysis

Application of CCPM in ATE Program Management

2009 IEEE AUTOTESTCON ◽

10.1109/autest.2009.5314029 ◽

2009 ◽

Author(s):

Michael VanOverloop ◽

Shane A. Peterson

Keyword(s):

Program Management

Mission assurance through Test Program Set analysis

2009 IEEE AUTOTESTCON ◽

10.1109/autest.2009.5314070 ◽

2009 ◽

Author(s):

Yonet A. Eracar ◽

Teresa Lopes

Keyword(s):

Test Program ◽

Mission Assurance

Technical program chair message

2009 IEEE AUTOTESTCON ◽

10.1109/autest.2009.5314078 ◽

2009 ◽

Author(s):

Mike Ellis

Keyword(s):

Technical Program ◽

Program Chair

Adaptation of thermal testing for real - time testing in both the factory and depot

2009 IEEE AUTOTESTCON ◽

10.1109/autest.2009.5314055 ◽

2009 ◽

Author(s):

Duane Lowenstein

Keyword(s):

Real Time ◽

Thermal Testing

Instrument design that solves the challenges of both legacy and emerging test requirements

2009 IEEE AUTOTESTCON ◽

10.1109/autest.2009.5314080 ◽

2009 ◽

Cited By ~ 1

Author(s):

Carl Heide ◽

David Kaushansky

Keyword(s):

Instrument Design ◽

Test Requirements