29th VLSI Test Symposium
Latest Publications

TOTAL DOCUMENTS

69

(FIVE YEARS 0)

H-INDEX

11

(FIVE YEARS 0)

Published By IEEE

9781612846576

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Harmony Widget for X-free scan testing

29th VLSI Test Symposium ◽

10.1109/vts.2011.5783725 ◽

2011 ◽

Author(s):

Dilip K. Bhavsar

Keyword(s):

Scan Testing

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Test and characterization of high-speed circuits

29th VLSI Test Symposium ◽

10.1109/vts.2011.5783745 ◽

2011 ◽

Author(s):

Saghir Shaikh

Keyword(s):

High Speed

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Low-cost diagnostic pattern generation and evaluation procedures for noise-related failures

29th VLSI Test Symposium ◽

10.1109/vts.2011.5783739 ◽

2011 ◽

Cited By ~ 6

Author(s):

Junxia Ma ◽

Nisar Ahmed ◽

Mohammad Tehranipoor

Keyword(s):

Low Cost ◽

Pattern Generation ◽

Evaluation Procedures

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Design for Bit Error Rate estimation of high speed serial links

29th VLSI Test Symposium ◽

10.1109/vts.2011.5783734 ◽

2011 ◽

Cited By ~ 2

Author(s):

Ujjwal Guin ◽

Chen-Huan Chiang

Keyword(s):

Bit Error Rate ◽

Error Rate ◽

High Speed ◽

Serial Links ◽

Rate Estimation

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Practical signal processing at mixed signal test venues - Trend removal, noise reduction, wideband signal capturing -

29th VLSI Test Symposium ◽

10.1109/vts.2011.5783741 ◽

2011 ◽

Cited By ~ 2

Author(s):

Hideo Okawara

Keyword(s):

Signal Processing ◽

Noise Reduction ◽

Mixed Signal ◽

Wideband Signal ◽

Trend Removal

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Impact of the application activity on intermittent faults in embedded systems

29th VLSI Test Symposium ◽

10.1109/vts.2011.5783782 ◽

2011 ◽

Cited By ~ 7

Author(s):

Julien Guilhemsang ◽

Olivier Heron ◽

Nicolas Ventroux ◽

Olivier Goncalves ◽

Alain Giulieri

Keyword(s):

Embedded Systems ◽

Intermittent Faults

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Programmable extended SEC-DED codes for memory errors

29th VLSI Test Symposium ◽

10.1109/vts.2011.5783774 ◽

2011 ◽

Cited By ~ 6

Author(s):

Valentin Gherman ◽

Samuel Evain ◽

Fabrice Auzanneau ◽

Yannick Bonhomme

Keyword(s):

Memory Errors

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Advanced methods for leveraging new test standards

29th VLSI Test Symposium ◽

10.1109/vts.2011.5783758 ◽

2011 ◽

Author(s):

Mike Laisne

Keyword(s):

Test Standards

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Power-aware test generation with guaranteed launch safety for at-speed scan testing

29th VLSI Test Symposium ◽

10.1109/vts.2011.5783778 ◽

2011 ◽

Cited By ~ 28

Author(s):

X. Wen ◽

K. Enokimoto ◽

K. Miyase ◽

Y. Yamato ◽

M. A. Kochte ◽

...

Keyword(s):

Test Generation ◽

Scan Testing

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On clustering of undetectable transition faults in standard-scan circuits

29th VLSI Test Symposium ◽

10.1109/vts.2011.5783772 ◽

2011 ◽

Cited By ~ 1

Author(s):

Irith Pomeranz

Keyword(s):

Transition Faults ◽

Scan Circuits

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