1997 IEEE International Integrated Reliability Workshop Final Report (Cat No 97TH8319) IRWS-97
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40

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Discussion Group Summary Wafer Level Reliability (wlr)

1997 IEEE International Integrated Reliability Workshop Final Report (Cat No 97TH8319) IRWS-97 ◽

10.1109/irws.1997.660299 ◽

2005 ◽

Author(s):

C. Messick ◽

S. Yankee

Keyword(s):

Discussion Group ◽

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Discussion Group Summary Report Designing in Reliability - Dir

1997 IEEE International Integrated Reliability Workshop Final Report (Cat No 97TH8319) IRWS-97 ◽

10.1109/irws.1997.660298 ◽

2005 ◽

Author(s):

M. Poulter ◽

W. Vigrass

Keyword(s):

Discussion Group ◽

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Discussion Group Summary Customer Reliability Requirements

1997 IEEE International Integrated Reliability Workshop Final Report (Cat No 97TH8319) IRWS-97 ◽

10.1109/irws.1997.660300 ◽

2005 ◽

Author(s):

I. Wylie ◽

A. Preussger

Keyword(s):

Discussion Group

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Discussion Group Summary Reliability Test Structures

1997 IEEE International Integrated Reliability Workshop Final Report (Cat No 97TH8319) IRWS-97 ◽

10.1109/irws.1997.660301 ◽

2005 ◽

Author(s):

T. Turner

Keyword(s):

Discussion Group ◽

Reliability Test

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A practical statistical technique to improve seal integrity and reliability of microelectronic packages

1997 IEEE International Integrated Reliability Workshop Final Report (Cat No 97TH8319) IRWS-97 ◽

10.1109/irws.1997.660302 ◽

2002 ◽

Author(s):

T.R. Narasimhan ◽

E.H. Trotter

Keyword(s):

Statistical Technique ◽

Seal Integrity ◽

Microelectronic Packages

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Isothermal versus standard wafer electromigration test for the characterization of metal systems

1997 IEEE International Integrated Reliability Workshop Final Report (Cat No 97TH8319) IRWS-97 ◽

10.1109/irws.1997.660308 ◽

2002 ◽

Author(s):

D. Brisbin ◽

T. Turner

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Optimized application of antenna structures in a WLR monitoring program [IC testing]

1997 IEEE International Integrated Reliability Workshop Final Report (Cat No 97TH8319) IRWS-97 ◽

10.1109/irws.1997.660277 ◽

2002 ◽

Author(s):

J. Fazekas ◽

W. Asam ◽

J. Von Hagen

Keyword(s):

Monitoring Program ◽

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Device design methodology and reliability strategy for deep sub-micron technology [DRAMs]

1997 IEEE International Integrated Reliability Workshop Final Report (Cat No 97TH8319) IRWS-97 ◽

10.1109/irws.1997.660315 ◽

2002 ◽

Author(s):

R. Divakaruni ◽

B. El-Kareh ◽

W.R. Tonti

Keyword(s):

Design Methodology ◽

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Charge pumping for DRAM retention diagnostic

1997 IEEE International Integrated Reliability Workshop Final Report (Cat No 97TH8319) IRWS-97 ◽

10.1109/irws.1997.660295 ◽

2002 ◽

Author(s):

J. Adkisson ◽

R. Divakaruni ◽

J. Slinkman

Keyword(s):

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High resolution electromigration measurements for reduction of the test time

1997 IEEE International Integrated Reliability Workshop Final Report (Cat No 97TH8319) IRWS-97 ◽

10.1109/irws.1997.660292 ◽

2002 ◽

Author(s):

C. De Keukeleire ◽

L. Tielemans ◽

P. De Pauw

Keyword(s):

High Resolution ◽

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