Device design methodology and reliability strategy for deep sub-micron technology [DRAMs]

Author(s):  
R. Divakaruni ◽  
B. El-Kareh ◽  
W.R. Tonti
2020 ◽  
Vol 51 (1) ◽  
pp. 683-686
Author(s):  
Kazuichiro Itonaga ◽  
Shoji Sudo ◽  
Jun Nishikawa ◽  
Kei Kimura ◽  
Hiroki Uchiyama ◽  
...  

2004 ◽  
Vol 51 (7) ◽  
pp. 1122-1128 ◽  
Author(s):  
S.S. Suryagandh ◽  
M. Garg ◽  
J.C.S. Woo

2014 ◽  
Vol 87 ◽  
pp. 1218-1221 ◽  
Author(s):  
Mahmoud M. Magdy ◽  
Nader A. Mansour ◽  
Ahmed M.R. Fath El-Bab ◽  
Samy F.M. Assal

1998 ◽  
Vol 45 (3) ◽  
pp. 634-642 ◽  
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J.-C. Lu ◽  
W.C. Holton ◽  
J.S. Fenner ◽  
S.C. Williams ◽  
K.W. Kim ◽  
...  

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