1997 IEEE International Conference on Microelectronic Test Structures Proceedings
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(FIVE YEARS 0)

Published By IEEE

0780332431

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A proposal for modeling substrate coupling in Si-MMICs and its experimental verification up to 40 GHz

1997 IEEE International Conference on Microelectronic Test Structures Proceedings ◽

10.1109/icmts.1997.589332 ◽

2002 ◽

Cited By ~ 2

Author(s):

M. Pfost ◽

H.-M. Rein

Keyword(s):

Experimental Verification ◽

Substrate Coupling

Yield prediction using calibrated critical area modelling

1997 IEEE International Conference on Microelectronic Test Structures Proceedings ◽

10.1109/icmts.1997.589292 ◽

2002 ◽

Cited By ~ 3

Author(s):

G.J. Gaston ◽

G.A. Allan

Keyword(s):

Yield Prediction ◽

Critical Area

A compact monitoring circuit for real-time on-chip diagnosis of hot-carrier induced degradation

1997 IEEE International Conference on Microelectronic Test Structures Proceedings ◽

10.1109/icmts.1997.589340 ◽

2002 ◽

Author(s):

H. Oner ◽

B. Bayrakci ◽

Y. Leblebici

Keyword(s):

Real Time ◽

Hot Carrier ◽

On Chip

Design and characterization of SiGe TFT devices and process using Stanford's test chip design environment

1997 IEEE International Conference on Microelectronic Test Structures Proceedings ◽

10.1109/icmts.1997.589363 ◽

2002 ◽

Author(s):

M.V. Kumar ◽

V. Subramanian ◽

K.C. Saraswat ◽

J.D. Plummer ◽

W. Lukaszek

Keyword(s):

Design Environment ◽

Test Chip ◽

Chip Design

GIDL-induced charge injection for characterization of plasma edge damage in CMOS devices

1997 IEEE International Conference on Microelectronic Test Structures Proceedings ◽

10.1109/icmts.1997.589348 ◽

2002 ◽

Cited By ~ 1

Author(s):

T. Brozek ◽

A. Sridharan ◽

J. Werking ◽

S.R. Anderson ◽

Y.D. Chan ◽

...

Keyword(s):

Charge Injection ◽

Plasma Edge ◽

Induced Charge ◽

Edge Damage

Novel structure to measure emitter-base misalignment

1997 IEEE International Conference on Microelectronic Test Structures Proceedings ◽

10.1109/icmts.1997.589374 ◽

2002 ◽

Author(s):

M. Fallon ◽

M. Redford ◽

K. Findlater ◽

M. Newsam

Keyword(s):

Novel Structure

Test structures to measure the heat capacity of CMOS layer sandwiches

1997 IEEE International Conference on Microelectronic Test Structures Proceedings ◽

10.1109/icmts.1997.589399 ◽

2002 ◽

Cited By ~ 2

Author(s):

M. von Arx ◽

O. Paul ◽

H. Baltes

Keyword(s):

Heat Capacity

Issues on short circuits in large on-chip power MOS-transistors using a modified checkerboard test structure

1997 IEEE International Conference on Microelectronic Test Structures Proceedings ◽

10.1109/icmts.1997.589365 ◽

2002 ◽

Cited By ~ 2

Author(s):

C. Hess ◽

L.H. Weiland ◽

R. Bornefeld

Keyword(s):

Test Structure ◽

Mos Transistors ◽

Short Circuits ◽

On Chip

Test structures for the evaluation of air-bridge interconnection in GaAs IC's fabrication process

1997 IEEE International Conference on Microelectronic Test Structures Proceedings ◽

10.1109/icmts.1997.589408 ◽

2002 ◽

Cited By ~ 1

Author(s):

M. Nakanishi ◽

M. Noda ◽

H. Nakano ◽

T. Sonoda ◽

M. Otsubo

Keyword(s):

Fabrication Process

A DC voltage capacitance matching tester

1997 IEEE International Conference on Microelectronic Test Structures Proceedings ◽

10.1109/icmts.1997.589394 ◽

2002 ◽

Author(s):

B.W. McNeill ◽

C. Hanle

Keyword(s):

Dc Voltage

1997 IEEE International Conference on Microelectronic Test Structures ProceedingsLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

A proposal for modeling substrate coupling in Si-MMICs and its experimental verification up to 40 GHz

Yield prediction using calibrated critical area modelling

A compact monitoring circuit for real-time on-chip diagnosis of hot-carrier induced degradation

Design and characterization of SiGe TFT devices and process using Stanford's test chip design environment

GIDL-induced charge injection for characterization of plasma edge damage in CMOS devices

Novel structure to measure emitter-base misalignment

Test structures to measure the heat capacity of CMOS layer sandwiches

Issues on short circuits in large on-chip power MOS-transistors using a modified checkerboard test structure

Test structures for the evaluation of air-bridge interconnection in GaAs IC's fabrication process

A DC voltage capacitance matching tester

1997 IEEE International Conference on Microelectronic Test Structures Proceedings
Latest Publications