2020 IEEE International Test Conference India
Latest Publications

TOTAL DOCUMENTS

20

(FIVE YEARS 20)

H-INDEX

0

(FIVE YEARS 0)

Published By IEEE

9781728174587

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Modeling and Test Generation for Combinational Hardware Trojans

2020 IEEE International Test Conference India ◽

10.1109/itcindia49857.2020.9171791 ◽

2020 ◽

Author(s):

Manisha Vinta ◽

S. Sivanantham

Keyword(s):

Test Generation ◽

Hardware Trojans

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ITC India 2020 Keyword Index

2020 IEEE International Test Conference India ◽

10.1109/itcindia49857.2020.9171787 ◽

2020 ◽

Keyword(s):

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Resource Optimal Realization of Fault-Tolerant Quantum Circuit

2020 IEEE International Test Conference India ◽

10.1109/itcindia49857.2020.9171796 ◽

2020 ◽

Author(s):

Abhoy Kole ◽

Indranil Sengupta

Keyword(s):

Fault Tolerant ◽

Quantum Circuit

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ITC India 2020 Table of Contents

2020 IEEE International Test Conference India ◽

10.1109/itcindia49857.2020.9171781 ◽

2020 ◽

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ITC India 2020 Program Committee

2020 IEEE International Test Conference India ◽

10.1109/itcindia49857.2020.9171782 ◽

2020 ◽

Keyword(s):

Program Committee

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A Hash based Secure Scheme (HSS) against scanbased attacks on AES cipher

2020 IEEE International Test Conference India ◽

10.1109/itcindia49857.2020.9171790 ◽

2020 ◽

Author(s):

Jayesh Popat ◽

Usha Mehta ◽

Manisha Upadhyay

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Concealing Test Compression Mechanisms from Security Attacks

2020 IEEE International Test Conference India ◽

10.1109/itcindia49857.2020.9171789 ◽

2020 ◽

Author(s):

Utsav Jana ◽

Binod Kumar ◽

Ankita Agarwal ◽

Deepak Agrawal

Keyword(s):

Security Attacks ◽

Test Compression

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Efficient Fault Detection and Diagnosis of Digital Microfluidic Biochip Using Multiple Electrodes Actuation

2020 IEEE International Test Conference India ◽

10.1109/itcindia49857.2020.9171793 ◽

2020 ◽

Author(s):

Sourav Ghosh ◽

Dolan Maity ◽

Arijit Chowdhury ◽

Surajit Kumar Roy ◽

Chandan Giri

Keyword(s):

Fault Detection ◽

Fault Detection And Diagnosis ◽

Multiple Electrodes ◽

Detection And Diagnosis ◽

Digital Microfluidic

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Validating and Characterizing a 2.5D High Bandwidth Memory SubSystem

2020 IEEE International Test Conference India ◽

10.1109/itcindia49857.2020.9171795 ◽

2020 ◽

Author(s):

Sreeja Menon ◽

Vinod Inipodu Murugan

Keyword(s):

Memory Subsystem ◽

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A non-ICL UVM approach to verifying DFx IJTAG network and its pros and cons v/s the ICL-PDL approach

2020 IEEE International Test Conference India ◽

10.1109/itcindia49857.2020.9171799 ◽

2020 ◽

Author(s):

Ronak Dham ◽

Harish Gumudavelli

Keyword(s):

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