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Optical Micro- and Nanometrology VII
Latest Publications
TOTAL DOCUMENTS
34
(FIVE YEARS 0)
H-INDEX
2
(FIVE YEARS 0)
Published By SPIE
9781510618824, 9781510618831
Latest Documents
Most Cited Documents
Contributed Authors
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Latest Documents
Most Cited Documents
Contributed Authors
Related Sources
Related Keywords
Front Matter: Volume 10678
Optical Micro- and Nanometrology VII
◽
10.1117/12.2503291
◽
2018
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Keyword(s):
Matter Volume
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Ultrastable metrology laser at 633 nm using an optical frequency comb
Optical Micro- and Nanometrology VII
◽
10.1117/12.2306907
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2018
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Cited By ~ 2
Author(s):
Paul Köchert
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Ulrike Blumröder
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Eberhard Manske
Keyword(s):
Frequency Comb
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Optical Frequency Comb
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Optical Frequency
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Optical challenging feature inline measurement system based on photometric stereo and HON feature extractor
Optical Micro- and Nanometrology VII
◽
10.1117/12.2309891
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2018
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Cited By ~ 1
Author(s):
Huiyu Liu
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Yunhui Yan
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Kechen Song
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Howard Chen
Keyword(s):
Measurement System
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Photometric Stereo
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Feature Extractor
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Inline Measurement
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Holographic characterization and laser structuring of a microphone membrane
Optical Micro- and Nanometrology VII
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10.1117/12.2307487
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2018
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Author(s):
Bryan L. Nelsen
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Christopher Taudt
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Florian Rudek
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Peter Hartmann
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Paul Jacobs
Keyword(s):
Laser Structuring
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Deriving forces in a single beam gradient force optical tweezers using the angular spectrum method
Optical Micro- and Nanometrology VII
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10.1117/12.2307537
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2018
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Author(s):
Qin Yu
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Bryan Hennelly
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John Healy
Keyword(s):
Optical Tweezers
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Angular Spectrum
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Gradient Force
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Single Beam
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Spectrum Method
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Angular Spectrum Method
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Perturbation resistant RGB-interferometry with pulsed LED illumination
Optical Micro- and Nanometrology VII
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10.1117/12.2306221
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2018
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Cited By ~ 1
Author(s):
Markus Schake
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Peter Lehmann
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Lithographic diffraction grating with a period failure
Optical Micro- and Nanometrology VII
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10.1117/12.2306811
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2018
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Cited By ~ 2
Author(s):
Maria Shishova
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Sergey B. Odinokov
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Dmitriy S. Lushnikov
◽
Alexander Y. Zherdev
Keyword(s):
Diffraction Grating
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The original application of hybrid lens in micromeasurements for optical coherence tomography
Optical Micro- and Nanometrology VII
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10.1117/12.2317066
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2018
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Author(s):
Dmitrii I. Egorov
Keyword(s):
Optical Coherence Tomography
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Optical Coherence
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Original Application
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Application of coherence scanning interferometry for local spectral characterization of transparent layers
Optical Micro- and Nanometrology VII
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10.1117/12.2314921
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2018
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Author(s):
Rémy Claveau
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Paul Montgomery
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Manuel Flury
Keyword(s):
Spectral Characterization
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Interferometric measuring systems of nanopositioning and nanomeasuring machines
Optical Micro- and Nanometrology VII
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10.1117/12.2318309
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2018
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Author(s):
Tino Hausotte
Keyword(s):
Measuring Systems
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