Proceedings IEEE European Test Workshop
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System-level test bench generation in a co-design framework

2002 ◽  
Author(s):  
M. Lajolo ◽  
M. Rebaudengo ◽  
M. Sonza Reorda ◽  
M. Violante ◽  
L. Lavagno
Keyword(s):  
Test Bench ◽  
System Level ◽  
Design Framework

scholarly journals Bridging the testing speed gap: design for delay testability

2002 ◽  
Author(s):  
H. Speek ◽  
H.G. Kerkhoff ◽  
M. Sachdev ◽  
M. Shashaani
Keyword(s):  
Testing Speed

Microprocessor cores

2002 ◽  
Author(s):  
A. Burdass ◽  
G. Campbell ◽  
R. Grisenthwaite ◽  
D. Gwilt ◽  
P. Harrod ◽  
...  

Test challenges in nanometer technologies

2002 ◽  
Author(s):  
S. Kundu ◽  
S. Sengupta ◽  
R. Galivanche

Analyzing the test generation problem for an application-oriented test of FPGAs

2002 ◽  
Author(s):  
M. Renovell ◽  
J.M. Portal ◽  
P. Faure ◽  
J. Figueras ◽  
Y. Zorian
Keyword(s):  
Test Generation ◽  
Generation Problem

Hierarchical defect-oriented fault simulation for digital circuits

2002 ◽  
Author(s):  
M. Blyzniuk ◽  
T. Cibakova ◽  
E. Gramatova ◽  
W. Kuzmicz ◽  
M. Lobur ◽  
...  
Keyword(s):  
Digital Circuits ◽  
Fault Simulation
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