Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 1999 (IEEE Cat. No.99TH8396)
Latest Publications

TOTAL DOCUMENTS

50

(FIVE YEARS 0)

H-INDEX

10

(FIVE YEARS 0)

Published By ESD Assoc

158637007x

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Investigating the performance of conductive thick epoxy floors [ESD control]

Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 1999 (IEEE Cat. No.99TH8396) ◽

10.1109/eosesd.1999.819069 ◽

2003 ◽

Author(s):

M. Golane

Download Full-text

A study of ESD corrugated [protective packaging]

Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 1999 (IEEE Cat. No.99TH8396) ◽

10.1109/eosesd.1999.819000 ◽

2003 ◽

Author(s):

R.J. Vermillion ◽

L. Fromm

Keyword(s):

Protective Packaging

Download Full-text

Plasma-charging damage and ESD, help each other?

Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 1999 (IEEE Cat. No.99TH8396) ◽

10.1109/eosesd.1999.818987 ◽

2003 ◽

Author(s):

K.P. Cheung

Download Full-text

ESD damage of GMR sensors at head stack assembly

Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 1999 (IEEE Cat. No.99TH8396) ◽

10.1109/eosesd.1999.819087 ◽

2003 ◽

Author(s):

R. Zeng ◽

Yu Qun ◽

Fenggang Zhao ◽

Hong Tian

Keyword(s):

Download Full-text

ESD testing of head stack assemblies used in magnetic recording hard disk drives

Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 1999 (IEEE Cat. No.99TH8396) ◽

10.1109/eosesd.1999.819075 ◽

2003 ◽

Author(s):

A. Wallash

Keyword(s):

Magnetic Recording ◽

Hard Disk Drives ◽

Hard Disk ◽

Download Full-text

ESD damage by directly arcing to a MR head

Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 1999 (IEEE Cat. No.99TH8396) ◽

10.1109/eosesd.1999.819085 ◽

2003 ◽

Author(s):

Li-Yan Zhu

Download Full-text

Development of accelerated aging test for ESD/EMI protective materials and electrical discontinuity at seams and interconnections

Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 1999 (IEEE Cat. No.99TH8396) ◽

10.1109/eosesd.1999.819072 ◽

2003 ◽

Author(s):

R. Haynes

Keyword(s):

Accelerated Aging ◽

Accelerated Aging Test ◽

Download Full-text

Latent ESD failures in Schottky barrier diodes

Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 1999 (IEEE Cat. No.99TH8396) ◽

10.1109/eosesd.1999.819002 ◽

2003 ◽

Author(s):

Y. Anand ◽

D. Crowe

Keyword(s):

Schottky Barrier ◽

Schottky Barrier Diodes

Download Full-text

Investigations on double-diffused MOS (DMOS) transistors under ESD zap conditions

Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 1999 (IEEE Cat. No.99TH8396) ◽

10.1109/eosesd.1999.818984 ◽

2003 ◽

Author(s):

G. Boselli ◽

S. Meeuwsen ◽

T. Mouthaan ◽

F. Kuper

Download Full-text

Electrostatic test methods compared

Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 1999 (IEEE Cat. No.99TH8396) ◽

10.1109/eosesd.1999.818989 ◽

2003 ◽

Author(s):

R. Gompf ◽

P. Holdstock ◽

J. Chubb

Keyword(s):

Download Full-text