Capacitance Spectroscopy of Semiconductors
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Published By Jenny Stanford Publishing

9781315150130
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Advanced Instrumentation for High-Resolution Capacitance and Impedance Measurements

2018 ◽  
pp. 149-178
Author(s):  
Giorgio Ferrari ◽  
Marco Carminati
Keyword(s):  
High Resolution ◽  
Impedance Measurements

Basic Techniques for Capacitance and Impedance Measurements

2018 ◽  
pp. 117-147
Author(s):  
Marco Carminati ◽  
Giorgio Ferrari
Keyword(s):  
Impedance Measurements

Capacitance-Voltage and Drive-Level–Capacitance Profiling

2018 ◽  
pp. 85-113
Author(s):  
Jennifer T. Heath
Keyword(s):  
Drive Level ◽  
Capacitance Voltage

Deep-Level Transient Spectroscopy

2018 ◽  
pp. 61-84
Author(s):  
Johan Lauwaert ◽  
Samira Khelifi
Keyword(s):  
Deep Level Transient Spectroscopy ◽  
Deep Level ◽  
Transient Spectroscopy

Admittance Spectroscopy

2018 ◽  
pp. 25-59
Author(s):  
Thomas Walter
Keyword(s):  
Admittance Spectroscopy

Microwave Impedance Microscopy

2018 ◽  
pp. 411-435
Author(s):  
Yong-Tao Cuia ◽  
Eric Yue Ma

Capacitive Techniques for the Characterization of Organic Semiconductors

2018 ◽  
pp. 241-261
Author(s):  
Dario Natali ◽  
Mario Caironi
Keyword(s):  
Organic Semiconductors

Comparison of Capacitance Spectroscopy for PV Semiconductors

2018 ◽  
pp. 221-239
Author(s):  
Adam Halverson
Keyword(s):  
Capacitance Spectroscopy

scholarly journals Capacitance Spectroscopy for MOS Systems

2018 ◽  
pp. 263-307
Author(s):  
Salvador Dueñas ◽  
Helena Castán
Keyword(s):  
Capacitance Spectroscopy

Time Domain–Based Impedance Detection

2018 ◽  
pp. 179-218 ◽  
Author(s):  
Uwe Pliquett
Keyword(s):  
Time Domain
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