2020 IEEE International Integrated Reliability Workshop (IIRW)
Latest Publications

TOTAL DOCUMENTS

(FIVE YEARS 35)

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(FIVE YEARS 0)

Published By IEEE

9781728170589

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Summaries of Tutorials

2020 IEEE International Integrated Reliability Workshop (IIRW) ◽

10.1109/iirw49815.2020.9312878 ◽

2020 ◽

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Charge Pumping and Flicker Noise-based Defect Characterization in Ferroelectric FETs

2020 IEEE International Integrated Reliability Workshop (IIRW) ◽

10.1109/iirw49815.2020.9312851 ◽

2020 ◽

Author(s):

Yannick Raffel ◽

Maximilian Lederer ◽

Ricardo Olivo ◽

Franz Muller ◽

Raik Hoffmann ◽

...

Keyword(s):

Flicker Noise ◽

Defect Characterization ◽

Charge Pumping

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Circuit Reliability Analysis of In-Memory Inference in Binarized Neural Networks

2020 IEEE International Integrated Reliability Workshop (IIRW) ◽

10.1109/iirw49815.2020.9312858 ◽

2020 ◽

Author(s):

Tommaso Zanotti ◽

Francesco Maria Puglisi ◽

Paolo Pavan

Keyword(s):

Neural Networks ◽

Reliability Analysis ◽

Circuit Reliability

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DG01 - BEOL Failure Mechanismsin Advanced Nodes

2020 IEEE International Integrated Reliability Workshop (IIRW) ◽

10.1109/iirw49815.2020.9312850 ◽

2020 ◽

Download Full-text

Copyright Page

2020 IEEE International Integrated Reliability Workshop (IIRW) ◽

10.1109/iirw49815.2020.9312827 ◽

2020 ◽

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Plasma induced charging damage: From appropriate MOS test structures to antenna design rules, a comprehensive process qualification procedure

2020 IEEE International Integrated Reliability Workshop (IIRW) ◽

10.1109/iirw49815.2020.9312854 ◽

2020 ◽

Author(s):

Andreas Martin

Keyword(s):

Antenna Design ◽

Design Rules ◽

Process Qualification

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DG03 - Device Reliability Constraints for AI

2020 IEEE International Integrated Reliability Workshop (IIRW) ◽

10.1109/iirw49815.2020.9312872 ◽

2020 ◽

Keyword(s):

Device Reliability

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Addressing Weak Links in Automotive Reliability Semiconductor Contamination Control, Inspection and Test

2020 IEEE International Integrated Reliability Workshop (IIRW) ◽

10.1109/iirw49815.2020.9312862 ◽

2020 ◽

Author(s):

Andreas Aal ◽

Jennifer Braggin ◽

Antoine Amade ◽

Mark Puttock

Keyword(s):

Weak Links ◽

Contamination Control

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Challenges and solution approaches for simulation-based reliability assessment – degradation modeling

2020 IEEE International Integrated Reliability Workshop (IIRW) ◽

10.1109/iirw49815.2020.9312870 ◽

2020 ◽

Author(s):

Andre Lange ◽

Roland Jancke

Keyword(s):

Reliability Assessment ◽

Degradation Modeling ◽

Simulation Based

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ANtarctica: ANalog Thermal Aware, with Reduced Constraint, Technique for Checking & Analysis

2020 IEEE International Integrated Reliability Workshop (IIRW) ◽

10.1109/iirw49815.2020.9312856 ◽

2020 ◽

Author(s):

Sherif Hany ◽

Hany Fekri Ragai ◽

Emad Hegazi

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2020 IEEE International Integrated Reliability Workshop (IIRW)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Summaries of Tutorials

Charge Pumping and Flicker Noise-based Defect Characterization in Ferroelectric FETs

Circuit Reliability Analysis of In-Memory Inference in Binarized Neural Networks

DG01 - BEOL Failure Mechanismsin Advanced Nodes

Copyright Page

Plasma induced charging damage: From appropriate MOS test structures to antenna design rules, a comprehensive process qualification procedure

DG03 - Device Reliability Constraints for AI

Addressing Weak Links in Automotive Reliability Semiconductor Contamination Control, Inspection and Test

Challenges and solution approaches for simulation-based reliability assessment – degradation modeling

ANtarctica: ANalog Thermal Aware, with Reduced Constraint, Technique for Checking & Analysis

2020 IEEE International Integrated Reliability Workshop (IIRW)
Latest Publications