2011 Sixteenth IEEE European Test Symposium
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9781457704833
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Fault Masking and Diagnosis in Reversible Circuits

2011 ◽  
Author(s):  
Masoud Zamani ◽  
Navid Farazmand ◽  
Mehdi B. Tahoori
Keyword(s):  
Reversible Circuits ◽  
Fault Masking

A Functional Power Evaluation Flow for Defining Test Power Limits during At-Speed Delay Testing

2011 ◽  
Author(s):  
M. Valka ◽  
A. Bosio ◽  
L. Dilillo ◽  
P. Girard ◽  
S. Pravossoudovitch ◽  
...  
Keyword(s):  
Delay Testing ◽  
Test Power ◽  
Power Limits ◽  
Power Evaluation

Timing Vulnerability Factors of Ultra Deep-sub-micron CMOS

2011 ◽  
Author(s):  
Massoud Mokhtarpour Ghahroodi ◽  
Mark Zwolinski ◽  
Rick Wong ◽  
Shi-Jie Wen
Keyword(s):  
Vulnerability Factors

A Novel SRAM-Cell Based Input Vector Monitoring Concurrent BIST Architecture

2011 ◽  
Author(s):  
I. Voyiatzis ◽  
C. Efstathiou ◽  
H. Antonopoulou
Keyword(s):  
Input Vector ◽  
Sram Cell
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