Design-Process-Technology Co-optimization XV
Latest Publications

TOTAL DOCUMENTS

36
(FIVE YEARS 36)

H-INDEX

0
(FIVE YEARS 0)

Published By SPIE

9781510640610, 9781510640627
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Fast model-driven target optimization methods using machine learnings

2021 ◽  
Author(s):  
Marco Guajardo ◽  
Ahmed S. Omran ◽  
Howard Clark
Keyword(s):  
Optimization Methods ◽  
Model Driven

Using machine learning etch models in OPC and ILT correction

2021 ◽  
Author(s):  
Kevin Hooker ◽  
Lena Zavyalova ◽  
Shuo Huang ◽  
Li-Jin Chen
Keyword(s):  
Machine Learning

Ensuring reliable computation with unreliable devices in the era of AI/ML

2021 ◽  
Author(s):  
Divya Prasad ◽  
Rob Aitken
Keyword(s):  
Reliable Computation

Machine learning based recursive partitioning for simplifying OPC model building complexity

2021 ◽  
Author(s):  
Apoorva Oak ◽  
Soobin Hwang ◽  
Ruoxia Chen ◽  
Shinill Kang ◽  
Ryan Ryoung-Han Kim
Keyword(s):  
Machine Learning ◽  
Model Building ◽  
Recursive Partitioning

Machine-learning assisted fast critical area analysis

2021 ◽  
Author(s):  
Uwe Paul Schroeder ◽  
Janam Bakshi ◽  
David Villarreal
Keyword(s):  
Machine Learning ◽  
Critical Area

Pattern-centric yield management approach with machine learning to detect and track defects with full chip coverage

2021 ◽  
Author(s):  
Yu Zhang ◽  
Shirui Yu ◽  
Jiaqi Liu ◽  
Renyang Meng ◽  
Long Yin ◽  
...  
Keyword(s):  
Machine Learning ◽  
Yield Management ◽  
Management Approach

Design-technology co-optimization of sequential and monolithic CFET as enabler of technology node beyond 2nm

2021 ◽  
Author(s):  
Bilal Chehab ◽  
Julien Ryckaert ◽  
Pieter Schuddinck ◽  
Pieter Weckx ◽  
Naoto Horiguchi ◽  
...  
Keyword(s):  
Design Technology ◽  
Technology Node

Welcome and Introduction to SPIE Conference 11614

2021 ◽  
Author(s):  
Chi-Min Yuan ◽  
Ryoung-Han R. Kim
Load More ...
Sign in / Sign up

Export Citation Format

Share Document