PICMET '99: Portland International Conference on Management of Engineering and Technology. Proceedings Vol-1: Book of Summaries (IEEE Cat. No.99CH36310)
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524

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Published By Portland Int. Conf. Manage. Eng. & Technol. PICMET

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Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Graduate management of technology education: a global survey

PICMET '99: Portland International Conference on Management of Engineering and Technology. Proceedings Vol-1: Book of Summaries (IEEE Cat. No.99CH36310) ◽

10.1109/picmet.1999.787793 ◽

2003 ◽

Cited By ~ 1

Author(s):

S. Nambisan ◽

D. Wilemon

Keyword(s):

Technology Education ◽

Global Survey ◽

Management Of Technology

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The technological transfer in the textile industry-a case in the Paraiba state

PICMET '99: Portland International Conference on Management of Engineering and Technology. Proceedings Vol-1: Book of Summaries (IEEE Cat. No.99CH36310) ◽

10.1109/picmet.1999.808526 ◽

2003 ◽

Author(s):

D. Santos da Costa ◽

C.E. Barbosa de Lima ◽

F.A. Cavalcanti da Silva

Keyword(s):

Textile Industry ◽

Technological Transfer

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Information technology diffusion: a comparative case study of intranet adoption

PICMET '99: Portland International Conference on Management of Engineering and Technology. Proceedings Vol-1: Book of Summaries (IEEE Cat. No.99CH36310) ◽

10.1109/picmet.1999.807692 ◽

2003 ◽

Author(s):

G.A. Zolla

Keyword(s):

Information Technology ◽

Technology Diffusion ◽

Comparative Case Study

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Strategic flexibility as a key weapon in a competitive environment: a brief study applied to the Brazilian machine-tools industry

PICMET '99: Portland International Conference on Management of Engineering and Technology. Proceedings Vol-1: Book of Summaries (IEEE Cat. No.99CH36310) ◽

10.1109/picmet.1999.808401 ◽

2003 ◽

Author(s):

S.E.G. da Costa ◽

A. Fleury

Keyword(s):

Machine Tools ◽

Competitive Environment ◽

Strategic Flexibility

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Accelerating team learning in new product development

PICMET '99: Portland International Conference on Management of Engineering and Technology. Proceedings Vol-1: Book of Summaries (IEEE Cat. No.99CH36310) ◽

10.1109/picmet.1999.808055 ◽

2003 ◽

Author(s):

D.L. Green ◽

D.L. Wilemon

Keyword(s):

Product Development ◽

New Product Development ◽

Team Learning ◽

New Product

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Managing high-tech computer security against smart and persistent intruders

PICMET '99: Portland International Conference on Management of Engineering and Technology. Proceedings Vol-1: Book of Summaries (IEEE Cat. No.99CH36310) ◽

10.1109/picmet.1999.808543 ◽

2003 ◽

Author(s):

G. Ross ◽

G. Samid

Keyword(s):

Computer Security ◽

High Tech

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Contributions for understanding the concurrent engineering

PICMET '99: Portland International Conference on Management of Engineering and Technology. Proceedings Vol-1: Book of Summaries (IEEE Cat. No.99CH36310) ◽

10.1109/picmet.1999.808516 ◽

2003 ◽

Author(s):

K. Hatakeyama ◽

C.C. Estorilio Gouvea da Costa

Keyword(s):

Concurrent Engineering

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Role of 'champions of collaboration' in fostering inter-organizational collaboration

PICMET '99: Portland International Conference on Management of Engineering and Technology. Proceedings Vol-1: Book of Summaries (IEEE Cat. No.99CH36310) ◽

10.1109/picmet.1999.807742 ◽

2003 ◽

Author(s):

R. Smith ◽

M. Ahmed

Keyword(s):

Organizational Collaboration

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Information society-impacts in the organizational structure, in the telework and in the workers' health

PICMET '99: Portland International Conference on Management of Engineering and Technology. Proceedings Vol-1: Book of Summaries (IEEE Cat. No.99CH36310) ◽

10.1109/picmet.1999.807825 ◽

2003 ◽

Author(s):

M.B.deF. Lima ◽

L.B. da Silva ◽

F.A.P. Fialho

Keyword(s):

Organizational Structure ◽

Information Society

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Yield/cost modeling for electronics wafer fabrication and evaluation of the impact of minimum acceptable die yield criteria on statistical wafer and die yields and costs

PICMET '99: Portland International Conference on Management of Engineering and Technology. Proceedings Vol-1: Book of Summaries (IEEE Cat. No.99CH36310) ◽

10.1109/picmet.1999.808366 ◽

2003 ◽

Author(s):

C.A. D'Cruz

Keyword(s):

Cost Modeling ◽

Wafer Fabrication ◽

Yield Criteria ◽

The Impact

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PICMET '99: Portland International Conference on Management of Engineering and Technology. Proceedings Vol-1: Book of Summaries (IEEE Cat. No.99CH36310)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Portland Int. Conf. Manage. Eng. & Technol. PICMET

Graduate management of technology education: a global survey

The technological transfer in the textile industry-a case in the Paraiba state

Information technology diffusion: a comparative case study of intranet adoption

Strategic flexibility as a key weapon in a competitive environment: a brief study applied to the Brazilian machine-tools industry

Accelerating team learning in new product development

Managing high-tech computer security against smart and persistent intruders

Contributions for understanding the concurrent engineering

Role of 'champions of collaboration' in fostering inter-organizational collaboration

Information society-impacts in the organizational structure, in the telework and in the workers' health

Yield/cost modeling for electronics wafer fabrication and evaluation of the impact of minimum acceptable die yield criteria on statistical wafer and die yields and costs

PICMET '99: Portland International Conference on Management of Engineering and Technology. Proceedings Vol-1: Book of Summaries (IEEE Cat. No.99CH36310)
Latest Publications