Proceedings of IEEE International Workshop on Memory Technology, Design, and Test
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Published By IEEE Comput. Soc. Press

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Mega bit BiCMOS SRAM chip package modelling and performance analysis

Proceedings of IEEE International Workshop on Memory Technology, Design, and Test ◽

10.1109/mtdt.1994.397204 ◽

2002 ◽

Author(s):

V.N. Rayapati ◽

B. Kaminska

Keyword(s):

Performance Analysis ◽

And Performance

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A transparent built-in self-test scheme for detecting single V-coupling faults in RAMs

Proceedings of IEEE International Workshop on Memory Technology, Design, and Test ◽

10.1109/mtdt.1994.397187 ◽

2002 ◽

Author(s):

B.F. Cockburn ◽

Y.-F.N. Sat

Keyword(s):

Test Scheme ◽

Coupling Faults ◽

Self Test ◽

Built In Self Test

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On fault modeling and testing of content-addressable memories

Proceedings of IEEE International Workshop on Memory Technology, Design, and Test ◽

10.1109/mtdt.1994.397193 ◽

2002 ◽

Author(s):

W.K. Al-Assadi ◽

A.P. Jayasumana ◽

Y.K. Malaiya

Keyword(s):

Fault Modeling ◽

Content Addressable Memories

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A self-diagnostic BIST memory design scheme

Proceedings of IEEE International Workshop on Memory Technology, Design, and Test ◽

10.1109/mtdt.1994.397205 ◽

2002 ◽

Author(s):

Chin Tsung Mo ◽

Chung Len Lee ◽

Wen Ching Wu

Keyword(s):

Memory Design ◽

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Electrical failure analysis in high density DRAMs

Proceedings of IEEE International Workshop on Memory Technology, Design, and Test ◽

10.1109/mtdt.1994.397201 ◽

2002 ◽

Author(s):

A. Chan ◽

D. Lam ◽

W. Tan ◽

Swee Yong Khim

Keyword(s):

Failure Analysis ◽

High Density ◽

Electrical Failure

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Total dose radiation hardening and testing issues of GaAs static memories

Proceedings of IEEE International Workshop on Memory Technology, Design, and Test ◽

10.1109/mtdt.1994.397184 ◽

2002 ◽

Author(s):

A. Srivastava ◽

M. Ganeshan

Keyword(s):

Radiation Hardening ◽

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A fault-tolerant multiprocessor cache memory

Proceedings of IEEE International Workshop on Memory Technology, Design, and Test ◽

10.1109/mtdt.1994.397197 ◽

2002 ◽

Author(s):

Xiao Luo ◽

J.C. Muzio

Keyword(s):

Fault Tolerant ◽

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Radiation hardening of dynamic memories by the use of a new dummy cell concept

Proceedings of IEEE International Workshop on Memory Technology, Design, and Test ◽

10.1109/mtdt.1994.397186 ◽

2002 ◽

Author(s):

H. Schleifer ◽

T. v.d. Ropp ◽

W. Reczek

Keyword(s):

Radiation Hardening

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Mega bit CMOS SRAM chip failure analysis using external electrical testing and internal contactless laser beam testing

Proceedings of IEEE International Workshop on Memory Technology, Design, and Test ◽

10.1109/mtdt.1994.397200 ◽

2002 ◽

Author(s):

V.N. Rayapati ◽

B. Kaminska

Keyword(s):

Failure Analysis

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An on-chip test scheme for SRAMs

Proceedings of IEEE International Workshop on Memory Technology, Design, and Test ◽

10.1109/mtdt.1994.397203 ◽

2002 ◽

Author(s):

P.K. Lala ◽

A. Walker

Keyword(s):

Test Scheme ◽

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